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Materials - Nanotechnology | Springer Handbook of Nanotechnology

Springer Handbook of Nanotechnology

Volume package: Springer Handbooks

Bhushan, Bharat (Ed.)

2004, XXXVI, 1222p. 972 illus. in color. eReference.


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ISBN 978-3-540-29838-0

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Since 2004 the Springer Handbook of Nanotechnology has established itself as the definitive reference in the Nanoscience field.  It integrates the knowledge from nanofabrication, nanomechanics, materials science, and reliability engineering in just one volume. Reflecting further developments, the new edition has grown from six to eight parts and from 38 to 58 chapters. Existing chapters have been thoroughly updated and new material has been added to cover developing fields such as bionanotechnology, nanorobotics, and NEMS/MEMS reliability. This classic reference book addresses mechanical and electrical engineers, materials scientists, physicists and chemists who work either in the nano area or in a field that is or will be influenced by this new key technology.

From the reviews of the first edition:

"The strong point is its focus on many of the practical aspects of nanotechnology... Anyone working in or learning about the field of nanotechnology would find this an excellent working handbook.’’ IEEE Electrical Insulation Magazine

"Outstandingly succeeds in its aim… It really is a magnificent volume and every scientific library and nanotechnology group should have a copy." Materials World

"The integrity and authoritativeness… is guaranteed by an experienced editor and an international team of authors which have well summarized in their chapters information on fundamentals and applications." Polymer News

Key Topics

    • Nanostructures
    • Nanomechanics
    • NEMS /MEMS
    • Micro/Nanofabrication
    • Micro/Nanodevice Reliability
    • Scanning Probe and Force Microscopies
    • Nanotribology and Nanorheology
    • Nanorobotics
    • Molecular Technology
    • Bionanotechnology
    • Therapeutic Nanodevices
    • Industrial Applications
    • Social and Ethical Aspects


  • Covers basic concepts, theory, materials, properties, and fabrication.
  • Contains over 1500 two-color illustrations
  • Numerous comprehensive materials data tables.
  • Features exhaustive references to approved data.
  • A detailed index and fully searchable CD-ROM guarantee quick access to data.


Content Level » Research

Keywords » MRWCat2006 - NEMS/MEMS - Nanodevices - Nanofabrication - Nanomaterials - Nanomechanics - Nanostructures - Nanosystems - Nanotribology - Reliability of Nanosystems - Scanning Probe Microscopy - Self-Assembled Monolayers - Surfaces - Thin Films

Related subjects » Electronics & Electrical Engineering - Mechanics - Nanotechnology - Surfaces, Interfaces, Thin Films, Corrosion, Coatings

Table of contents 

Foreword by Neal Lane

Foreword by James R. Heath

Introduction to Nanotechnology.-

Part A Nanostructures, Micro- Nanofabrication, and Materials: Nanomaterials Synthesis and Applications: Molecule Based Devices.- Introduction to Carbon Nanotubes.- Nanowires.- Template-Based Growth of Nanorod Arrays.- Three-Dimensional Nanofabrication Using Focused-Ion-Beam Chemical-Vapor-Deposition.- Introduction to Micro/Nanofabrication.- Nanoimprint Lithography.- Stamping Techniques for Micro- Nanofabrication: Methods and Applications.- Materials Aspects of Micro- and Nanoelectromechanical Systems.- Engineering Decentralized Nanoscale Systems.- Nanometer-Scale Thermoelectric Materials.- Nano- and Microstructured Semiconductor Materials for Macroelectronics

Part B MEMS/NEMS and BioMEMS/NEMS: Next Generation Microelectronic Array Devices.- MEMS/NEMS Devices and Applications.- Nanomechanical Cantilever Array Sensors.- Therapeutic Nanodevices.- G-protein Coupled Receptors (GPCRs).- Microfluids and Lab-on-a-Chip.- Centrifuge-Based Fluidic Platform.- Micro/Nano Droplets in Microfluidic Devices

Part C Scanning Probe Microscopy: Scanning Probe Microscopy.- Probes in Scanning Microscopies.- Noncontact Atomic Force Microscopy.- Low Temperature Scanning Probe Microscopy.- Higher Harmonic Force Detection in Dynamic Force Microscopy.- Dynamic Modes of Atomic Force Microscopy.- Molecular Recognition Force Microscopy

Part D Nanotribology and Nanomechanics: Nanotribology, Nanomechanics, and Materials Characterization.- Surface Forces and Nanorheology of Molecularly Thin Films.- Interfacial Forces and Spectroscopy of Confined Fluids.- Friction and Wear on the Atomic Scale.- Velocity Dependent Nature of Nanoscale Friction, Adhesion and Wear.- Computational Modeling of Nanometer-Scale Friction and Indentation.- Nanoscale Mechanical Properties.- Nanomechanical Properties of Solid Surfaces and Thin Films.-Scale Effects in Mechanical Properties and Tribology.- Mechanics of Biological Nanotechnology.- Characterization of Human Hair.- Mechanical Properties of Nanostructures

Part E Molecularly Thick Films for Lubrication: Nanotribology of Ultrathin and Hard Amorphous Carbon Films.- Self-Assembled Monolayers for Controlling Adhesion, Friction, and Wear.- Nanoscale Boundary Lubrication Studies.- Kinetics and Energetics

Part F Industrial Applications: The "Millipede" – A Nanotechnology-Based AFM Data-Storage System.- Nanotechnology for Data Storage Applications.- Microactuators for Dual-Stage Servo Systems in Magnetic Disk Files.- Nanorobotics

Part G Micro- Nanodevice Reliability: Nanotribology and Nanomechanics of MEMS/NEMS and BioMEMS/NEMS.- Experimental Characterization Techniques for Micro- Nanoscale Devices.- Failure Mechanisms in MEMS Devices.- Mechanical Properties of Micromachined Structures.- Thermo- and Electromechanical Behavior of Thin-Film Micro- and Nanostructures.- High Volume Manufacturing and Field Stability of MEMS Products.- Packaging and Reliability Issues in Micro- Nano Systems

Part H Technological Convergence and Governing Nanotechnology: Technological Convergence from the Nanoscale.- Governing Nanotechnology: Social, Ethical, and Political Issues

About the Authors

Subject Index

System requirements 

Drive: CD-ROM: 48x; DVD-ROM Free disk space: 60 MB Operating system: Linux: Kernel 2.2; Macintosh: MacOS 9.x; Unix; Windows: 2000, 95, 98 SE, ME, NT 4.0, XP Processor: Apple Power Mac G3, PC with more than 75 MHz RAM: 64 MB

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