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Materials - Conferences in Materials - M & M Conference | Springer @ the MandM

Welcome to the Springer @ MandM 2012 Site!

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Don't Miss These Highlights

Springer Handbook of Metrology and Testing

Horst Czichos, Tetsuya Saito, Leslie E. Smith (Eds.)



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Atom Probe Microscopy

B. Gault, M.P. Moody, J.M. Cairney, S.P. Ringer ... More

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The Microscopy Zone

Visit the Springer Microscopy Zone to find out more about world-leading books in the Science of Microscopy. ... More

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