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Scanning Probe Microscopy of Functional Materials

Nanoscale Imaging and Spectroscopy

  • Book
  • © 2011

Overview

  • Serves the rapidly developing field of nanoscale characterization of functional materials properties

  • Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors

  • Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations

  • Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization

  • Includes supplementary material: sn.pub/extras

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Table of contents (18 chapters)

  1. Thermal Characterization by SPM

  2. Electrical and Electromechanical SPM

  3. Novel SPM concepts

Keywords

About this book

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Editors and Affiliations

  • , NanoTransport Laboratory, Oak Ridge National Laboratory, Oak Ridge, USA

    Sergei V. Kalinin

  • Dept. Materials Science and Engineering, Department of Physics & Astronomy, University of Nebraska - Lincoln, Lincoln, USA

    Alexei Gruverman

About the editors

Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

Bibliographic Information

  • Book Title: Scanning Probe Microscopy of Functional Materials

  • Book Subtitle: Nanoscale Imaging and Spectroscopy

  • Editors: Sergei V. Kalinin, Alexei Gruverman

  • DOI: https://doi.org/10.1007/978-1-4419-7167-8

  • Publisher: Springer New York, NY

  • eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)

  • Copyright Information: Springer Science+Business Media, LLC 2011

  • Hardcover ISBN: 978-1-4419-6567-7Published: 10 December 2010

  • Softcover ISBN: 978-1-4939-3947-3Published: 23 August 2016

  • eBook ISBN: 978-1-4419-7167-8Published: 13 December 2010

  • Edition Number: 1

  • Number of Pages: XVIII, 555

  • Topics: Characterization and Evaluation of Materials

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