Overview
- Serves as a practical guide for the operation of the technique and analysis of the data
- Covers state-of-the-art instrumentation and theories
- Includes new and revised data analysis methods and applications
- Includes supplementary material: sn.pub/extras
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Table of contents (7 chapters)
Keywords
About this book
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Authors and Affiliations
Bibliographic Information
Book Title: Atom-Probe Tomography
Book Subtitle: The Local Electrode Atom Probe
Authors: Michael K. Miller, Richard G. Forbes
DOI: https://doi.org/10.1007/978-1-4899-7430-3
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media New York 2014
Hardcover ISBN: 978-1-4899-7429-7Published: 02 August 2014
Softcover ISBN: 978-1-4899-7790-8Published: 17 September 2016
eBook ISBN: 978-1-4899-7430-3Published: 31 July 2014
Edition Number: 1
Number of Pages: XVIII, 423
Number of Illustrations: 120 b/w illustrations, 62 illustrations in colour
Topics: Characterization and Evaluation of Materials, Solid State Physics, Spectroscopy and Microscopy, Nanotechnology