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Local Electrode Atom Probe Tomography

A User's Guide

  • Book
  • © 2013

Overview

Authors:
  1. David J. Larson

    1. Cameca Instruments, Inc., Madison, USA

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    You can also search for this author in PubMed   Google Scholar

  2. Ty J. Prosa

    1. CAMECA Instruments, Inc., Madison, USA

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    You can also search for this author in PubMed   Google Scholar

  3. Robert M. Ulfig

    1. CAMECA Instruments, Inc., Madison, USA

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  4. Brian P. Geiser

    1. CAMECA Instruments, Inc., Madison, USA

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  5. Thomas F. Kelly

    1. Cameca Instruments, Inc., Madison, USA

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  • Written from the user perspective by the developers of the instrument themselves
  • Covers the main features of a local electrode atom probe tomography experiment from start to finish
  • Contains practical hints and tutorial information that is useful to any atom probe operator to improve the chances of a successful analysis
  • Includes a chapter on hardware/instrumentation, which explains to the novice user the various parts of the instrument and how they operate
  • Provides an overview of the software methods employed in LEAP, including reconstruction and data analysis
  • Includes supplementary material: sn.pub/extras

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xvii
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  2. History of APT and LEAP

    • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 1-23

  3. Specimen Preparation

    • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 25-53

  4. Design and Instrumentation

    • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 55-77

  5. Data Collection

    • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 79-108

  6. Data Processing and Reconstruction

    • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 109-162

  7. Selected Analysis Topics

    • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 163-199

  8. Applications of the Local Electrode Atom Probe

    • David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 201-247

  9. Back Matter

    Pages 249-318
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Keywords

About this book

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

Authors and Affiliations

  • Cameca Instruments, Inc., Madison, USA

    David J. Larson, Thomas F. Kelly

  • CAMECA Instruments, Inc., Madison, USA

    Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser

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