Logo - springer
Slogan - springer

Materials - Characterization & Evaluation of Materials | Atom Probe Microscopy

Atom Probe Microscopy

Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P.

2012, XXIV, 396 p.

Available Formats:
eBook
Information

Springer eBooks may be purchased by end-customers only and are sold without copy protection (DRM free). Instead, all eBooks include personalized watermarks. This means you can read the Springer eBooks across numerous devices such as Laptops, eReaders, and tablets.

You can pay for Springer eBooks with Visa, Mastercard, American Express or Paypal.

After the purchase you can directly download the eBook file or read it online in our Springer eBook Reader. Furthermore your eBook will be stored in your MySpringer account. So you can always re-download your eBooks.

 
$149.00

(net) price for USA

ISBN 978-1-4614-3436-8

digitally watermarked, no DRM

Included Format: PDF and EPUB

download immediately after purchase


learn more about Springer eBooks

add to marked items

Hardcover
Information

Hardcover version

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.

 
$189.00

(net) price for USA

ISBN 978-1-4614-3435-1

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days


add to marked items

Softcover
Information

Softcover (also known as softback) version.

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.

 
$189.00

(net) price for USA

ISBN 978-1-4899-8939-0

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days


add to marked items

  • Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques
  • Presents a detailed description of the analysis tools
  • Includes practical examples of how the technique can be used in materials science research
  • Stands as a must-have reference for any user of atom probe microscopy

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.


Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

  • Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques
  • Presents a detailed description of the analysis tools
  • Includes practical examples of how the technique can be used in materials science research
  • Stands as a must-have reference for any user of atom probe microscopy

Content Level » Research

Keywords » Atom probe data analysis - Atom probe data quality - Atom probe microscopy book - Atom probe microscopy materials science - Atom probe microscopy specimen preparation - Atom probe tomography - Experimental protocols, atom probe microscopy - Field desorption - Field evaporation - Field ion microscopy - Tomographic reconstruction

Related subjects » Characterization & Evaluation of Materials - Chemistry - Condensed Matter Physics - Nanotechnology - Optics & Lasers

Table of contents / Preface / Sample pages 

Popular Content within this publication 

 

Articles

Read this Book on Springerlink

Services for this book

New Book Alert

Get alerted on new Springer publications in the subject area of Characterization and Evaluation of Materials.