Logo - springer
Slogan - springer

Materials - Characterization & Evaluation of Materials | Electron Energy-Loss Spectroscopy in the Electron Microscope

Electron Energy-Loss Spectroscopy in the Electron Microscope

Egerton, Ray

3rd ed. 2011, XII, 491 p.

Available Formats:
eBook
Information

Springer eBooks may be purchased by end-customers only and are sold without copy protection (DRM free). Instead, all eBooks include personalized watermarks. This means you can read the Springer eBooks across numerous devices such as Laptops, eReaders, and tablets.

You can pay for Springer eBooks with Visa, Mastercard, American Express or Paypal.

After the purchase you can directly download the eBook file or read it online in our Springer eBook Reader. Furthermore your eBook will be stored in your MySpringer account. So you can always re-download your eBooks.

 
$219.00

(net) price for USA

ISBN 978-1-4419-9583-4

digitally watermarked, no DRM

Included Format: PDF and EPUB

download immediately after purchase


learn more about Springer eBooks

add to marked items

Hardcover
Information

Hardcover version

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.

 
$279.00

(net) price for USA

ISBN 978-1-4419-9582-7

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days


add to marked items

Softcover
Information

Softcover (also known as softback) version.

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.

 
$279.00

(net) price for USA

ISBN 978-1-4899-8649-8

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days


add to marked items

  • Considered the "Bible of EELS"
  • Presents the only in-depth, single-author text for the still-expanding field of TEM-EELS
  • Responds to many requests for the first new edition of this classic work since 1996
  • Includes discussion of new spectrometer and detector designs, together with spectral-analysis techniques such as Bayesian deconvolution and multivariate statistical analysis
  • Provides extended discussion of anisotropic materials, retardation effects, delocalization of inelastic scattering, and the simulation of energy-loss fine structure.
  • Describes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials.
  • Offers extended coverage of radiation damage and delocalization as limits to spatial resolution.
  • From reviews of the first and second edition:
  • "The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging." – JMSA
  • "Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference." -- American Scientist

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.  In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

  • Considered the "Bible of EELS"
  • Presents the only in-depth, single-author text for the still-expanding field of TEM-EELS
  • Responds to many requests for the first new edition of this classic work since 1996
  • Includes discussion of new spectrometer and detector designs, together with spectral-analysis techniques such as Bayesian deconvolution and multivariate statistical analysis
  • Provides extended discussion of anisotropic materials, retardation effects, delocalization of inelastic scattering, and the simulation of energy-loss fine structure.
  • Describes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials.
  • Offers extended coverage of radiation damage and delocalization as limits to spatial resolution.

From reviews of the first and second edition:

"The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging." – JMSA

"Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference." -- American Scientist

Content Level » Research

Keywords » Analytical Electron Microscopy book - EELS materials science book - Inelastic scattering of electrons - Transmission Electron Microscopy book - computing partial ionization cross-sections - image-filtering systems - spectrum deconvolution

Related subjects » Analytical Chemistry - Characterization & Evaluation of Materials - Materials - Nanotechnology - Optics & Lasers

Table of contents / Preface / Sample pages 

Popular Content within this publication 

 

Articles

Read this Book on Springerlink

Services for this book

New Book Alert

Get alerted on new Springer publications in the subject area of Characterization and Evaluation of Materials.