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Materials - Characterization & Evaluation of Materials | Scanning Probe Microscopy - Electrical and Electromechanical Phenomena at the Nanoscale (Reviews)

Scanning Probe Microscopy

Electrical and Electromechanical Phenomena at the Nanoscale

Kalinin, Sergei V., Gruverman, Alexei

2007, XL, 980 p. (2-volume-set, not available separately).

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ISBN 978-0-387-28668-6

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From the reviews:

"The stated goal of this book is ‘to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.’ … The images are particularly clear even to the non-specialist eyes. … The black and white and color figures are of good quality. The photographs are all excellent. … will be helpful to materials scientists in universities and research centers." (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)

 

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