Overview
- Presents cross-comparison between materials characterization techniques
- Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem
- Focuses on applications and clear data interpretation without extensive mathematics
- Includes supplementary material: sn.pub/extras
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Table of contents (5 chapters)
Keywords
About this book
Editors and Affiliations
About the editor
Mauro Sardela (editor) is a Senior Research Scientist and Manager of the X-Ray Analysis Laboratory at the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Dr. Sardela received his PhD in Material Science, in 1994, from the Institute of Physics of Materials, Linköping University, Sweden. He has authored and co-authored several publications in the area of x-ray scattering, materials analysis in general, with focus on semiconductors, complex oxides, nanomaterials, etc.
Judith E. Baker was a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory, University of Illinois. She began working with SIMS in the early 1970's and continued until she retired in 2003. Her collaborative efforts with researchers at the University of Illinois, other universities, and National Laboratories resulted in co-authorship of over 90 reviewed journal publications. Most of the publications include SIMS applications and involve a wide variety of materials.
Richard T. Haasch is a Senior Research Scientist and leader of the electron spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in analytical chemistry from the University of Minnesota in 1990. He has authored or co-authored over 90 publications and presentations in the area of surface analysis, materials characterization, and materials chemistry.
Julio A.N.T. Soares is a Senior Research Scientist and manager of the Laser and Spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in Solid State Physics from the University of Sao Paulo, Brazil, in 1997. He has authored or co-authored several publications and presentations in the area of opticalcharacterization of materials.
Jianguo Wen is a Materials Scientist at Electron Microscopy Center, Argonne National Laboratory. He received his Ph.D. in condensed matter physics from Institute of Physics, Chinese Academy of Sciences in 1991. He is author or co-author of over 200 publications in peer-reviewed journals in the area of transmission electron microscopy, complex oxides, nanomaterials, Li-ion batteries, superconductors, and semiconductors. With total number of citations over 6500, 15 papers were cited over 100 times.
Bibliographic Information
Book Title: Practical Materials Characterization
Editors: Mauro Sardela
DOI: https://doi.org/10.1007/978-1-4614-9281-8
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media New York 2014
Hardcover ISBN: 978-1-4614-9280-1
Softcover ISBN: 978-1-4939-4298-5
eBook ISBN: 978-1-4614-9281-8
Edition Number: 1
Number of Pages: VII, 237
Number of Illustrations: 26 b/w illustrations, 92 illustrations in colour
Topics: Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Mass Spectrometry