Overview
Written by experts in the field
Provides thorough treatment of the most appropiate microscopy techniques of importance to studying nanostructured materials
Includes supplementary material: sn.pub/extras
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Table of contents (22 chapters)
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Front Matter
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Optical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication
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Front Matter
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Electron Microscopy
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Front Matter
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Keywords
About this book
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Reviews
From the reviews:
"Nanostructured materials have a rich variety of properties … . This complete reference provides a thorough treatment of these techniques and their applications." (Materials Today, 2005)
Editors and Affiliations
Bibliographic Information
Book Title: Handbook of Microscopy for Nanotechnology
Editors: Nan Yao, Zhong Lin Wang
DOI: https://doi.org/10.1007/1-4020-8006-9
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag US 2005
Hardcover ISBN: 978-1-4020-8003-6Published: 21 March 2005
eBook ISBN: 978-1-4020-8006-7Published: 12 July 2006
Edition Number: 1
Number of Pages: XX, 731
Topics: Characterization and Evaluation of Materials, Nanotechnology, Condensed Matter Physics, Analytical Chemistry