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Table of contents (113 papers)
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Front Matter
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Epitaxy: Wide Band-Gap Nitrides
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Front Matter
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Epitaxy: Silicon-Germanium Alloys
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Front Matter
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About this book
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.
Editors and Affiliations
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Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, UK
A. G. Cullis
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Department of Materials, University of Oxford, Oxford, UK
J. L. Hutchison
Bibliographic Information
Book Title: Microscopy of Semiconducting Materials
Book Subtitle: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
Editors: A. G. Cullis, J. L. Hutchison
Series Title: Springer Proceedings in Physics
DOI: https://doi.org/10.1007/3-540-31915-8
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2005
Hardcover ISBN: 978-3-540-31914-6Published: 10 April 2006
Softcover ISBN: 978-3-642-06870-6Published: 19 October 2010
eBook ISBN: 978-3-540-31915-3Published: 25 August 2006
Series ISSN: 0930-8989
Series E-ISSN: 1867-4941
Edition Number: 1
Number of Pages: XVI, 540
Topics: Materials Science, general, Electronics and Microelectronics, Instrumentation, Circuits and Systems, Solid State Physics, Spectroscopy and Microscopy, Measurement Science and Instrumentation