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Nanoscale Characterisation of Ferroelectric Materials

Scanning Probe Microscopy Approach

  • Book
  • © 2004

Overview

Editors:
  1. Marin Alexe

    1. Max Planck Institute of Microstructure Physics, Halle (Saale), Germany

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    You can also search for this editor in PubMed   Google Scholar

  2. Alexei Gruverman

    1. Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  • First one on nanoscale characterization of ferroelectric materials
  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (9 chapters)

  1. Front Matter

    Pages I-XIII
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  2. Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces

    • S. V. Kalinin, D. A. Bonnell
    Pages 1-43

  3. Challenges in the Analysis of the Local Piezoelectric Response

    • C. Harnagea, A. Pignolet
    Pages 45-85

  4. Electrical Characterization of Nanoscale Ferroelectric Structures

    • S. Tiedke, T. Schmitz
    Pages 87-114

  5. Nanoscale Optical Probes of Ferroelectric Materials

    • J. Levy, O. Tikhomirov
    Pages 115-142

  6. Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization

    • Y. Cho
    Pages 143-162

  7. Nanoscale Piezoelectric Phenomena in Epitaxial PZT Thin Films

    • V. Nagarajan, A. Roytburd, R. Ramesh
    Pages 163-191

  8. Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions

    • M. Abplanalp, M. Zgonik, P. Günter
    Pages 193-220

  9. Nanodomain Engineering in Ferroelectric Crystals Using High Voltage Atomic Force Microscopy

    • Y. Rosenwaks, M. Molotskii, A. Agronin, P. Urenski, M. Shvebelman, G. Rosenman
    Pages 221-265

  10. Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in PZT Thin Films

    • L. M. Eng, S. Grafström, C. Loppacher, X. M. Lu, F. Schlaphof, K. Franke et al.
    Pages 267-277

  11. Back Matter

    Pages 279-282
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Keywords

About this book

Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com­ puter industry is turning to nanotechnology as a source of new processes and func­ tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro­ electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the "nano-era", a solid knowledge of the ferroelectric properties at the nano­ scale needs to be acquired. While the science of ferroelectrics from micro-to lar­ ger scale is well established, the science of nanoscale ferroelectrics is still terra in­ cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec­ ade.

Reviews

From the reviews:

"The aim of this book is to present recent advances in nanoscale characterization of electrical, mechanical and optical properties of ferroelectric materials made possible due to the use of the SPM techniques. … will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. … The book succeeds in being informative, balanced and intelligent … . The references at the end of each chapter also make the book consistently informative and steadily rewarding." (Current Engineering Practice, Vol. 47 (3), 2004-2005)

Editors and Affiliations

  • Max Planck Institute of Microstructure Physics, Halle (Saale), Germany

    Marin Alexe

  • Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA

    Alexei Gruverman

Bibliographic Information

  • Book Title: Nanoscale Characterisation of Ferroelectric Materials

  • Book Subtitle: Scanning Probe Microscopy Approach

  • Editors: Marin Alexe, Alexei Gruverman

  • Series Title: NanoScience and Technology

  • DOI: https://doi.org/10.1007/978-3-662-08901-9

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 2004

  • Hardcover ISBN: 978-3-540-20662-0Published: 06 April 2004

  • Softcover ISBN: 978-3-642-05844-8Published: 15 December 2010

  • eBook ISBN: 978-3-662-08901-9Published: 09 March 2013

  • Series ISSN: 1434-4904

  • Series E-ISSN: 2197-7127

  • Edition Number: 1

  • Number of Pages: XIII, 282

  • Topics: Magnetism, Magnetic Materials, Nanotechnology, Condensed Matter Physics, Engineering, general, Metallic Materials

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