Journal of Electronic Testing is among the journals recognized for Editorial Excellence. Editor-in-Chief Dr. Vishwani Agrawal performed in the top 10% of qualifying journals* based on data collected from the Journal Author Satisfaction survey. Click here for more information: https://www.springernature.com/gp/editors/campaigns/editorial-excellence


The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes: testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

  • Publishes the latest research results and applications in electronic testing
  • Features a rapid submission to publication cycle
  • Publishes conference papers of exceptional merit and surveys and reviews examining the state of the art in the field
  • 100% of authors who answered a survey reported that they would definitely publish or probably publish in the journal again

Journal information

Main Editor
  • Vishwani Agrawal
Publishing model
Hybrid (Transformative Journal). How to publish with us, including Open Access

Journal metrics

0.795 (2021)
Impact factor
0.979 (2021)
Five year impact factor
68 days
Submission to first decision (Median)
42,631 (2021)
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This journal has 26 open access articles

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About this journal

Electronic ISSN
1573-0727
Print ISSN
0923-8174
Abstracted and indexed in
  1. ACM Digital Library
  2. BFI List
  3. Baidu
  4. CLOCKSS
  5. CNKI
  6. CNPIEC
  7. Current Contents Collections / Electronics & Telecommunications Collection
  8. Current Contents/Engineering, Computing and Technology
  9. DBLP
  10. Dimensions
  11. EBSCO Academic Search
  12. EBSCO Discovery Service
  13. EBSCO STM Source
  14. EI Compendex
  15. Google Scholar
  16. INIS Atomindex
  17. INSPEC
  18. Japanese Science and Technology Agency (JST)
  19. Journal Citation Reports/Science Edition
  20. Naver
  21. Norwegian Register for Scientific Journals and Series
  22. OCLC WorldCat Discovery Service
  23. Portico
  24. ProQuest Abstracts in New Technologies and Engineering (ANTE)
  25. ProQuest Advanced Technologies & Aerospace Database
  26. ProQuest Aluminium Industry Abstracts
  27. ProQuest-ExLibris Primo
  28. ProQuest-ExLibris Summon
  29. SCImago
  30. SCOPUS
  31. Science Citation Index Expanded (SCIE)
  32. TD Net Discovery Service
  33. UGC-CARE List (India)
  34. WTI AG
  35. Wanfang
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