Journal of Electronic Testing - Announcing the Winners of the 2021 Best Paper Prize

Congratulations to the authors of Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects (this opens in a new tab)! Don't miss the article, which is open access. Find below the authors' biographies: 

Thiago Santos Copetti graduated in 2012 and received his Master of Science Degree in 2015, both in Electrical Engineering at Pontifical Catholic University of Rio Grande do Sul (PUCRS), Brazil. In 2020 he did his thesis defence at the Federal University of Rio Grande do Sul (UFRGS). At the moment, he works as a Postdoc at the Chair of Integrated Digital Systems and Circuit Design (IDS) at RWTH University, Germany. His fields of interest include Fault Tolerant Integrated Circuits, Memory Testing, Single Event Upset (SEU) and Negative Bias Temperature Instability (NBTI) Aware, Design of Integrated Circuits and Memories, and also emerging technologies, such as memristors.

Guilherme Cardoso Medeiros received his B.Sc. and M.Sc. from the Pontifical Catholic University of Rio Grande do Sul, Brazil, in 2015 and 2017, respectively. He obtained his Ph.D. degree from the Delft University of Technology, the Netherlands, in 2022. He is currently a Test Engineer in NXP Semiconductors, the Netherlands. His main areas of interest are test strategies for SRAMs, defect and fault modeling for FinFET devices, and emerging memory technologies.

Mottaqiallah Taouil  received the M.Sc. and Ph.D. degrees (Hons.) in  computer engineering from the Delft University of Technology, Delft, The Netherlands, in 2009 and 2014, respectively. He is currently an Assistant Professor at the Computer Engineering Laboratory, Delft University of Technology. His current research interests include hardware security, embedded systems, 3-D stacked integrated circuits, VLSI design and test, built-in- self-test, design for testability, yield analysis, and memory test structures.

Hamdioui is currently Head of the Quantum and Computer Engineering department at Delft University of Technology (TUDelft), the Netherlands. He is also co-founder and CEO of Cognitive-IC, a start-up focusing on hardware dependability solutions. Hamdioui received the MSEE and PhD degrees (both with honors) from TUDelft. Prior to joining TUDelft as a professor, he worked at Intel (Califorina), Philips Semiconductors R&D (France) and Philips/ NXP Semiconductors (The Netherlands). His research focuses on two domains: emerging technologies and computing paradigms and hardware dependability.  He owns many patents, has published one book and contributed to other two, and had co-authored over 250 conference and journal papers. 

Leticia Maria Bolzani Poehls graduated in Computer Science at the Federal University of Pelotas (Brazil) in 2001 In the year 2004 she received her M.Sc. Degree in Electrical Engineering at Pontifical Catholic University of Rio Grande do Sul (Brazil) and in 2008 her Ph.D. in Computer Engineering from the Politecnico di Torino (Italy). From 2010 to 2022 she was Professor of the School of Technology of the PUCRS. Currently, she is a senior researcher at RWTH Aachen University working on test and reliability of emerging technology-based applications. She is member of the Steering Committee for the IEEE LATS and BELAS.

Tiago Roberto Balen received the Electrical Engineering degree, MSc and PhD degrees from Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, in 2004, 2006, and 2010, respectively. His research interests include analog and mixed-signal test, built-in-self test, programmable analog devices, fault tolerant circuits and radiation effects on electronic systems. He has published more than 70 papers on these topics in conferences and journals, receiving four “Best Paper Awards”. He has participated of the organizing committee of several conferences, such as LATS (steering committee member), LASCAS, IMSTW and SBCCI. He is an IEEE member with active participation in several societies and committees: TTTC, CEDA, CAS, EDS and SSCS. Currently, he is an associate professor at the Electrical Engineering department and head of the graduate program on Microelectronics (PGMICRO) of UFRGS.

Explore historical winners of this prize here (this opens in a new tab).