Overview
- Editors:
-
-
Rudy Lauwereins
-
IMEC vzw and Katholieke Universiteit, Leuven, Belgium
-
Jan Madsen
-
Informatics and Mathematical Modelling, Technical University of Denmark, Denmark
- Comprehensive historical overview of the evolutions in the last 10 years in the field of design, automation and test
- Contains the most influential papers selected from Europe’s most important conference on Design, Automation and Test (DATE)
- Most influential papers placed into historical context by recognized experts
Access this book
Other ways to access
Table of contents (36 chapters)
-
-
System Level Design
-
-
- Petru Eles, Krzysztof Kuchcinski, Zebo Peng, Alexa Doboli, Paul Pop
Pages 15-29
-
- Ashok Halambi, Peter Grun, Vijay Ganesh, Asheesh Khare, Nikil Dutt, Alex Nicolau
Pages 31-45
-
- Andreas Gerstlauer, Haobo Yu, Daniel D. Gajski
Pages 47-58
-
- Marek Jersak, Rafik Henia, Rolf Ernst
Pages 59-72
-
- Hyeonjoong Cho, Binoy Ravindran, E. Douglas Jensen
Pages 73-85
-
-
Networks on Chip
-
-
- Pierre Guerrier, Alain Greiner
Pages 111-123
-
- E. Rijpkema, K. G. W. Goossens, A. Rădulescu, J. Dielissen, J. van Meerbergen, P. Wielage et al.
Pages 125-139
-
- Jingcao Hu, Radu Marculescu
Pages 141-155
-
- Antoine Jalabert, Srinivasan Murali, Luca Benini, Giovanni De Micheli
Pages 157-171
-
- Shankar Mahadevan, Federico Angiolini, Jens Sparsø, Michael Storgaard, Jan Madsen, Rasmus Grøndahl Olsen
Pages 173-184
-
Modeling, Simulation and Run-Time Management
-
-
- Eui-Young Chung, Luca Benini, Alessandro Bogliolo, Giovanni De Micheli
Pages 195-206
-
- Yung-Hsiang Lu, Eui-Young Chung, Tajana Šimunić, Luca Benini, Giovanni De Micheli
Pages 207-219
-
- Bruno Bougard, Francky Catthoor, Denis C. Daly, Anantha Chandrakasan, Wim Dehaene
Pages 221-234
-
- Amith Singhee, Rob A. Rutenbar
Pages 235-251
-
- Kai Chen, Janos Sztipanovits, Sandeep Neema
Pages 253-265
About this book
The Design Automation and Test in Europe, DATE, is Europe’s leading international electronic systems design conference for electronic design, automation and test, from system level hardware and software implementation right down to integrated circuit design. It combines the conference with Europe’s leading international ex- bition for electronic design, automation and test. To celebrate the tenth anniversary of DATE, we have compiled this book with the aim to highlight some of the most influential technical contributions from ten years of DATE. Selecting 30 papers, only 3 papers from each year, is a challenging endeavor. Although the impact of papers from the first years of DATE can be det- mined through various citation indexes, the impact from the later years still have to be seen. Together with all 10 Program Chairs, we have made a selection of the most influential papers covering the very broad range of topics which is characteristic for DATE.
Editors and Affiliations
-
IMEC vzw and Katholieke Universiteit, Leuven, Belgium
Rudy Lauwereins
-
Informatics and Mathematical Modelling, Technical University of Denmark, Denmark
Jan Madsen
About the editors
Dr. Rudy Lauwereins is the General Chair for DATE 2007, Dr. Jan Madsen is the Technical Chair.