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Optical and Electronic Process of Nano-Matters

  • Book
  • © 2001

Overview

Editors:
  1. Motoichi Ohtsu

    1. Tokyo Institute of Technology, Yokohama, Japan

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Part of the book series: Advances in Opto-Electronics (ADOP, volume 8)

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Table of contents (11 chapters)

  1. Front Matter

    Pages i-xii
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  2. Electronic and Electromagnetic Properties in Nanometer Scales

    • H. Hori
    Pages 1-55

  3. Electron Transport in Semiconductor Quantum Dots

    • S. Tarucha, D. G. Austing, T. Fujisawa, L. P. Kouwenhoven
    Pages 57-93

  4. Electron Energy Modulation with Optical Evanescent Waves

    • J. Bae, K. Mizuno
    Pages 95-122

  5. Interactions of Electrons and Electromagnetic Fields in a Single Molecule

    • H. Nejo, Z.-C. Dong
    Pages 123-145

  6. Theory of Electronic and Atomic Processes in Scanning Probe Microscopy

    • M. Tsukada, N. Sasaki, N. Kobayashi
    Pages 147-179

  7. Tunneling-Electron Luminescence Microscopy for Multifunctional and Real-Space Characterization of Semiconductor Nanostructures

    • T. Murashita
    Pages 181-200

  8. Near-Field Optical Spectroscopy of Single Quantum Dots

    • T. Saiki
    Pages 201-218

  9. Chemical Vapor Deposition of Nanometric Materials by Optical Near-Fields: Toward Nano-Photonic Integration

    • M. Ohtsu, G. H. Lee
    Pages 219-234

  10. Noncontact Atomic Force Microscopy

    • S. Morita, Y. Sugawara
    Pages 235-276

  11. Correlation between Interface States and Structures Deduced from Atomic-Scale Surface Roughness in Ultrathin SiO2/Si System

    • T. Hattori, H. Nohira, K. Takahashi
    Pages 277-297

  12. Characterization of Molecular Films by a Scanning Probe Microscope

    • M. Hara, K. Kudo
    Pages 299-328

  13. Back Matter

    Pages 329-334
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Keywords

About this book

Sizes of electronic and photonic devices are decreasing drastically in order to increase the degree of integration for large-capacity and ultrahigh­ speed signal transmission and information processing. This miniaturization must be rapidly progressed from now onward. For this progress, the sizes of materials for composing these devices will be also decreased to several nanometers. If such a nanometer-sized material is combined with the photons and/or some other fields, it can exhibit specific characters, which are considerably different from those ofbulky macroscopic systems. This combined system has been called as a mesoscopic system. The first purpose of this book is to study the physics of the mesoscopic system. For this study, it is essential to diagnose the characteristics of miniaturized devices and materials with the spatial resolution as high as several nanometers or even higher. Therefore, novel methods, e.g., scanning probe microscopy, should be developed for such the high-resolution diagnostics. The second purpose of this book is to explore the possibility of developing new methods for these diagnostics by utilizing local interaction between materials and electron, photon, atomic force, and so on. Conformation and structure of the materials of the mesoscopic system can be modified by enhancing the local interaction between the materials and electromagnetic field. This modification can suggest the possibility of novel nano-fabrication methods. The third purpose of this book is to explore the methods for such nano-fabrication.

Editors and Affiliations

  • Tokyo Institute of Technology, Yokohama, Japan

    Motoichi Ohtsu

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