Electron Nano-Imaging

Basics of Imaging and Diffraction for TEM and STEM

Authors: Tanaka, Nobuo

  • The first textbook for graduate students to explain the imaging mechanism of STEM in detail as well as TEM
  • Straightforward description focusing on imaging of TEM and STEM, by relegating supporting knowledge to the appendices
  • Contains a consistent description of TEM and STEM imaging on the basis of Fourier transform theory
  • Includes appendices and exercises useful for graduate students
see more benefits

Buy this book

eBook 65,44 €
price for Spain (gross)
  • ISBN 978-4-431-56502-4
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 80,07 €
price for Spain (gross)
  • ISBN 978-4-431-56500-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
About this Textbook

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

About the authors

Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC). He received a ph.D degree from Applied Physics Department of Nagoya University in 1978, and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004. He was the director of the institute from 2012 to 2015. He is also the president of Japanese Microscopy Society (JSM) from 2015 to 2017. His professionals are high-resolution electron microscopy and nano-diffraction, and physics of atomic clusters and thin films as well as surfaces and interfaces of semiconductors. He is also the editor/author of a textbook as Scanning Transmission Electron Microscopy of Nanomaterials.

Table of contents (31 chapters)

  • Seeing Nanometer-Sized World

    Tanaka, Nobuo

    Pages 3-15

    Preview Buy Chapter 30,19 €
  • Structure and Imaging of a Transmission Electron Microscope (TEM)

    Tanaka, Nobuo

    Pages 17-28

    Preview Buy Chapter 30,19 €
  • Basic Theories of TEM Imaging

    Tanaka, Nobuo

    Pages 29-42

    Preview Buy Chapter 30,19 €
  • Resolution and Image Contrast of a Transmission Electron Microscope (TEM)

    Tanaka, Nobuo

    Pages 43-57

    Preview Buy Chapter 30,19 €
  • What is High-Resolution Transmission Electron Microscopy?

    Tanaka, Nobuo

    Pages 59-72

    Preview Buy Chapter 30,19 €

Buy this book

eBook 65,44 €
price for Spain (gross)
  • ISBN 978-4-431-56502-4
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Immediate eBook download after purchase
Hardcover 80,07 €
price for Spain (gross)
  • ISBN 978-4-431-56500-0
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
  • The final prices may differ from the prices shown due to specifics of VAT rules
Loading...

Recommended for you

Loading...

Bibliographic Information

Bibliographic Information
Book Title
Electron Nano-Imaging
Book Subtitle
Basics of Imaging and Diffraction for TEM and STEM
Authors
Copyright
2017
Publisher
Springer Japan
Copyright Holder
Springer Japan KK
eBook ISBN
978-4-431-56502-4
DOI
10.1007/978-4-431-56502-4
Hardcover ISBN
978-4-431-56500-0
Edition Number
1
Number of Pages
XXVIII, 333
Number of Illustrations and Tables
107 b/w illustrations, 22 illustrations in colour
Topics