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Progress in Materials Analysis

Vol. 2

  • Conference proceedings
  • © 1985

Overview

Editors:
  1. M. Grasserbauer

    1. Vienna, Austria

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  2. W. Wegscheider
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Part of the book series: Mikrochimica Acta Supplementa (MIKROCHIMICA, volume 11)

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Table of contents (28 papers)

  1. Front Matter

    Pages I-X
    Download chapter PDF

  2. Surface Characterization of Thin Organic Films on Metals

    • D. M. Hercules
    Pages 1-28

  3. Analysis of Very Thin Organic Fibres by Means of Small Spots Electron Spectroscopy for Chemical Analysis

    • S. M. Daiser, R. D. Cormia, L. Scharpen
    Pages 29-32

  4. Ion Implantation in the Surface Analysis of Solid Materials

    • W. H. Gries
    Pages 33-47

  5. Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations

    • H. Bubert
    Pages 49-69

  6. Microfocussed Ion Beams for Surface Analysis and Depth Profiling

    • M. Preuss, D. Kingham
    Pages 71-78

  7. Secondary Neutral Mass Spectrometry Depth Profile Analysis of Silicides

    • P. Beckmann, M. Kopnarski, H. Oechsner
    Pages 79-88

  8. Analysis of Thin Chromate Layers on Aluminium I. Opportunities and Limitations of Surface Analytical Methods

    • A. Quentmeier, H. Bubert, R. P. H. Garten, H. J. Heinen, H. Puderbach, S. Storp
    Pages 89-102

  9. Analysis of Thin Chromate Layers on Aluminium II. Structure and Composition of No-rinse Conversion Layers

    • H. Puderbach, H. Bubert, A. Quentmeier, R. P. H. Garten, S. Storp
    Pages 103-112

  10. Surface Analytical Investigation of the Corrosion Behaviour of Ti(Pd) Samples

    • G. Pfennig, H. Moers, H. Klewe-Nebenius, R. Kaufmann, H. J. Ache
    Pages 113-124

  11. Determination of the Lubricant Thickness Distribution on Magnetic Disks by Means of X-Ray Induced Volatilization and Simultaneous Photoelectron Spectroscopy

    • Manfred Schrader
    Pages 125-135

  12. Internal Quantification of Glow Discharge Optical Spectroscopy-Depth Profiles of Oxide and Nitride Layers on Metals

    • K. H. Koch, D. Sommer, D. Grunenberg
    Pages 137-144

  13. Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses

    • A. Lodding, H. Odelius, D. E. Clark, L. O. Werme
    Pages 145-161

  14. Neutral Primary Beam Secondary Ion Mass Spectrometry Analysis of Corrosion Phenomena on Glass Surfaces

    • T. Richter, G. H. Frischat, G. Borchardt, S. Scherrer, S. Weber
    Pages 163-170

  15. Quantitative Distribution Analysis of Phosphorus in Silicon with Secondary Ion Mass Spectrometry

    • G. Stingeder, M. Grasserbauer, U. Traxlmayr, E. Guerrero, H. Pötzl
    Pages 171-185

  16. Positron Studies of Defects in Metals and Semiconductors

    • Otto Brümmer, G. Dlubek
    Pages 187-204

  17. Kossel Technique and Positron Annihilation Used to Clarify Sintering Processes

    • W. Schatt
    Pages 205-227

  18. Selection and Qualification Tests of High Temperature Materials by Special Microanalytical Methods

    • Volker Thien
    Pages 229-261

  19. On the Application of Acoustic Emission Analysis to Evaluate the Integrity of Protective Coatings on High-Temperature Alloys

    • H. Jonas, D. Stöver, R. Hecker
    Pages 263-273

  20. Microprobe Measurements to Determine the Melt Equilibria of High-Alloy Nickel Materials

    • B. Prinz, G. Rudolph
    Pages 275-287
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Keywords

About this book

Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti­ tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol­ ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .

Editors and Affiliations

  • Vienna, Austria

    M. Grasserbauer

Bibliographic Information

  • Book Title: Progress in Materials Analysis

  • Book Subtitle: Vol. 2

  • Editors: M. Grasserbauer, W. Wegscheider

  • Series Title: Mikrochimica Acta Supplementa

  • DOI: https://doi.org/10.1007/978-3-7091-8840-8

  • Publisher: Springer Vienna

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag/Wien 1985

  • Softcover ISBN: 978-3-211-81905-0Published: 17 December 1985

  • eBook ISBN: 978-3-7091-8840-8Published: 06 December 2012

  • Series ISSN: 0076-8642

  • Edition Number: 1

  • Number of Pages: X, 382

  • Topics: Analytical Chemistry

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