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Characterization of Microstructures by Analytical Electron Microscopy (AEM)

  • Book
  • © 2012

Overview

Authors:
  1. Yonghua Rong

    1. School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, P. R. China

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  • Comprehensive introduction to Analytical Electron Microscopy with examples from Materials Science
  • Covers all aspects from theory to applications in the laboratory
  • First complete treatment of the subject since long, no competition

  • 4898 Accesses

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Table of contents (6 chapters)

  1. Front Matter

    Pages i-xviii
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  2. Analytical Electron Microscope (AEM)

    • Yonghua Rong
    Pages 1-35

  3. Specimen Preparation

    • Yonghua Rong
    Pages 37-66

  4. Electron Diffraction

    • Yonghua Rong
    Pages 67-170

  5. Mathematics Analysis in Electron Diffraction and Crystallography

    • Yonghua Rong
    Pages 171-293

  6. Diffraction Contrast

    • Yonghua Rong
    Pages 295-378

  7. High Resolution and High Spatial Resolution of Analytical Electron Microscopy

    • Yonghua Rong
    Pages 379-490

  8. Back Matter

    Pages 491-552
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Keywords

About this book

"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

Authors and Affiliations

  • School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, P. R. China

    Yonghua Rong

Bibliographic Information

  • Book Title: Characterization of Microstructures by Analytical Electron Microscopy (AEM)

  • Authors: Yonghua Rong

  • DOI: https://doi.org/10.1007/978-3-642-20119-6

  • Publisher: Springer Berlin, Heidelberg

  • Copyright Information: Higher Education Press, Beijing and Springer-Verlag Berlin Heidelberg 2012

  • Edition Number: 1

  • Number of Pages: XVIII, 552

  • Number of Illustrations: 375 b/w illustrations

  • Additional Information: Jointly published with Higher Education Press

  • Topics: Characterization and Evaluation of Materials, Condensed Matter Physics, Optics, Lasers, Photonics, Optical Devices

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