Applied Scanning Probe Methods X

1. Front Matter

   Pages I-LIX

   PDF

2. Gecko Feet: Natural Attachment Systems for Smart Adhesion-Mechanism, Modeling, and Development of Bio-Inspired Materials

   • Bharat Bhushan, Robert A. Sayer

   Pages 1-61

3. Carrier Transport in Advanced Semiconductor Materials

   • Filippo Giannazzo, Patrick Fiorenza, Vito Raineri

   Pages 63-103

4. Visualization of Fixed Charges Stored in Condensed Matter and Its Application to Memory Technology

   • Yasuo Cho

   Pages 105-130

5. Applications of Scanning Probe Methods in Chemical Mechanical Planarization

   • Toshi Kasai, Bharat Bhushan

   Pages 131-151

6. Scanning Probe Microscope Application for Single Molecules in a π-Conjugated Polymer Toward Molecular Devices Based on Polymer Chemistry

   • Ken-ichi Shinohara

   Pages 153-182

7. Scanning Probe Microscopy on Polymer Solar Cells

   • Joachim Loos, Alexander Alexeev

   Pages 183-215

8. Scanning Probe Anodization for Nanopatterning

   • Hiroyuki Sugimura

   Pages 217-255

9. Tissue Engineering: Nanoscale Contacts in Cell Adhesion to Substrates

   • Mario D’Acunto, Paolo Giusti, Franco Maria Montevecchi, Gianluca Ciardelli

   Pages 257-283

10. Scanning Probe Microscopy in Biological Research

    • Tatsuo Ushiki, Kazushige Kawabata

    Pages 285-308

11. Novel Nanoindentation Techniques and Their Applications

    • Jiping Ye

    Pages 309-345

12. Applications to Nano-Dispersion Macromolecule Material Evaluation in an Electrophotographic Printer

    • Yasushi Kadota

    Pages 347-358

13. Automated AFM as an Industrial Process Metrology Tool for Nanoelectronic Manufacturing

    • Tianming Bao, David Fong, Sean Hand

    Pages 359-412

14. Scanning Probe Microscope Application for Single Molecules in a π-Conjugated Polymer Toward Molecular Devices Based on Polymer Chemistry

    Pages e1-e1

15. Back Matter

    Pages 413-427

    PDF

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.

• AFM
• STEM
• Tissue Engineering
• ceramics
• microscopy
• modeling
• polymer

• Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA

  Bharat Bhushan

• Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan

  Masahiko Tomitori

• Institute of Physics, FB 16, University of Münster, Münster, Germany

  Harald Fuchs

Policies and ethics