Applied Scanning Probe Methods IX

1. Front Matter

   Pages I-LIX

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2. Ultrathin Fullerene-Based Films via STM and STS

   • Luca Gavioli, Cinzia Cepek

   Pages 1-21

3. Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode

   • Alexander M. Gigler, Othmar Marti

   Pages 23-54

4. Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers

   • Bruno Pignataro

   Pages 55-88

5. Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells

   • Félix Rico, Ewa P. Wojocikiewicz, Vincent T. Moy

   Pages 89-109

6. Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope

   • Claire Verbelen, Guillaume Andre, Xavier Haulot, Yann Gilbert, David Alsteens, Etienne Dague et al.

   Pages 111-126

7. Cellular Physiology of Epithelium and Endothelium

   • Christoph Riethmüller, Hans Oberleithner

   Pages 127-148

8. Application of Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell

   • Hyonchol Kim, Hironori Uehara, Rehana Afrin, Hideo Arakawa, Hiroshi Sekiguchi, Toshiya Osada et al.

   Pages 149-175

9. What Can Atomic Force Microscopy Say About Amyloid Aggregates?

   • Annalisa Relini, Ornella Cavalleri, Claudio Canale, Tiziana Svaldo-Lanero, Ranieri Rolandi, Alessandra Gliozzi

   Pages 177-205

10. Atomic Force Microscopy: Interaction Forces Measured in Phospholipid Monolayers, Bilayers and Cell Membranes

    • Zoya Leonenko, David T. Cramb, Matthias Amrein, Eric Finot

    Pages 207-234

11. Self-Assembled Monolayers on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability

    • Enamul Hoque, James A. DeRose, Bharat Bhushan, Hans Jörg Mathieu

    Pages 235-281

12. High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications

    • Nikhil S. Tambe, Bharat Bhushan

    Pages 283-310

13. Measurement of the Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM

    • Sung-Kyoung Kim, Haiwon Lee

    Pages 311-328

14. Evaluating Tribological Properties of Materials for Total Joint Replacements Using Scanning Probe Microscopy

    • Sriram Sundararajan, K. S. Kanaga Karuppiah

    Pages 329-350

15. Near-Field Optical Spectroscopy of Single Quantum Constituents

    • Toshiharu Saiki

    Pages 351-372

16. Back Matter

    Pages 373-387

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The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.

• AFM
• Fulleren
• Fullerene
• REM
• STM
• ceramics
• microscopy
• nanotechnology
• polymer
• spectroscopy

• Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan

  Masahiko Tomitori

• Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA

  Bharat Bhushan

• Institute of Physics, FB 16, University of Münster, Münster, Germany

  Harald Fuchs

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