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Progress in Transmission Electron Microscopy 2

Applications in Materials Science

  • Book
  • © 2001

Overview

  • Reviews the modern developments that have made transmission electron microscopy indispensible for materials research
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 39)

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About this book

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Bibliographic Information

  • Book Title: Progress in Transmission Electron Microscopy 2

  • Book Subtitle: Applications in Materials Science

  • Editors: Xiao-Feng Zhang, Ze Zhang

  • Series Title: Springer Series in Surface Sciences

  • Publisher: Springer Berlin, Heidelberg

  • Copyright Information: Springer-Verlag Berlin Heidelberg 2001

  • Hardcover ISBN: 978-3-540-67681-2Published: 18 October 2001

  • Softcover ISBN: 978-3-642-08718-9Published: 19 October 2010

  • Series ISSN: 0931-5195

  • Series E-ISSN: 2198-4743

  • Edition Number: 1

  • Number of Pages: XIV, 307

  • Additional Information: Jointly published with Tsinghua University Press, Beijing, China

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