Buy print copy
Tax calculation will be finalised at checkout
Bibliographic Information
Book Title: Physical Measurement and Analysis of Thin Films
Editors: E. M. Murt
Series Title: Progress in Analytical Chemistry
Publisher: Springer New York, NY
-
eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1969
Softcover ISBN: 978-1-4899-5912-6Published: 07 December 2013
Edition Number: 1
Number of Pages: XI, 194
Number of Illustrations: 99 b/w illustrations