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Photoelectronic Imaging Devices

Physical Processes and Methods of Analysis

  • Book
  • © 1971

Overview

Editors:
  1. Lucien M. Biberman

    1. Institute for Defense Analyses, Arlington, USA
      Department of Electrical Engineering, University of Rhode Island, Kingston, USA

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  2. Sol Nudelman

    1. Department of Electrical Engineering, University of Rhode Island, Kingston, USA

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: Optical Physics and Engineering (OPEG, volume 1)

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Table of contents (17 chapters)

  1. Front Matter

    Pages i-xxiv
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  2. Introduction

    1. Introduction

      • Sol Nudelman, Lucien M. Biberman
      Pages 1-5

  3. Radiometry, Photometry, and Vision

    1. Front Matter

      Pages 7-8
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    2. Luminance, Radiance, and Temperature

      • Lucien M. Biberman
      Pages 9-38

    3. Natural Levels of Illumination and Irradiance

      • Lucien M. Biberman
      Pages 39-67

    4. Visual Detection Process for Electrooptical Images: Man—The Final Stage of an Electrooptical Imaging System

      • Richard R. Legault
      Pages 69-87

    5. Visual Systems for Night Vision

      • A. D. Schnitzler
      Pages 89-108

  4. Basic Functions

    1. Front Matter

      Pages 109-110
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    2. Photoconductivity

      • G. Sadasiv
      Pages 111-146

    3. Photoemissive Cathodes: I. Photoemissive Surfaces in Imaging Devices

      • Martin Rome
      Pages 147-160

    4. Photoemmissive Cathodes: II. Recent Photocathode Developments, with Emphasis on III-V Compounds

      • C. H. A. Syms
      Pages 161-175

    5. Noise Performance of the Channel Electron Multiplier

      • William M. Sackinger
      Pages 177-191

    6. Electron Optics

      • J. Vine
      Pages 193-242

  6. Introduction to Systems

    1. Front Matter

      Pages 331-332
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    2. System Analysis

      • H. P. Lavin
      Pages 333-374
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Keywords

About this book

The past decade has seen a major resurgence in optical research and the teaching of optics in the major universities both in this country and abroad. Electrooptical devices have become achallenging subject of study that has penetrated both the electrical engineering and the physics departments of most major schools. There seems to be something about the laser that has appealed to both the practical electrical engineer with a hankering for fundamental research and to the fundamental physicist with a hankering to be practical. Somehow or other, this same form of enthusiasm has not previously existed in the study of photoelectronic devices that form images. This field of endeavor is becoming more and more sophisticated as newer forms of solid-state devices enter the field, not only in the data-processing end, but in the conversion of radiant energy into electrical charge patterns that are stored, manipulated, and read out in a way that a decade ago would have been considered beyond some fundamental limit or other.

Editors and Affiliations

  • Institute for Defense Analyses, Arlington, USA

    Lucien M. Biberman

  • Department of Electrical Engineering, University of Rhode Island, Kingston, USA

    Lucien M. Biberman, Sol Nudelman

Bibliographic Information

  • Book Title: Photoelectronic Imaging Devices

  • Book Subtitle: Physical Processes and Methods of Analysis

  • Editors: Lucien M. Biberman, Sol Nudelman

  • Series Title: Optical Physics and Engineering

  • DOI: https://doi.org/10.1007/978-1-4684-2928-2

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Plenum Press, New York 1971

  • Softcover ISBN: 978-1-4684-2930-5Published: 25 November 2012

  • eBook ISBN: 978-1-4684-2928-2Published: 13 March 2013

  • Edition Number: 1

  • Number of Pages: XXIV, 430

  • Number of Illustrations: 23 b/w illustrations

  • Topics: Science, Humanities and Social Sciences, multidisciplinary

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