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Table of contents (11 chapters)
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Front Matter
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Back Matter
Keywords
About this book
The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors.
... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge ofthat science...”.
From the Preface
Authors and Affiliations
Bibliographic Information
Book Title: Research Perspectives and Case Studies in System Test and Diagnosis
Authors: John W. Sheppard, William R. Simpson
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4615-5545-2
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1998
Hardcover ISBN: 978-0-7923-8263-8Published: 30 September 1998
Softcover ISBN: 978-1-4613-7535-7Published: 26 October 2012
eBook ISBN: 978-1-4615-5545-2Published: 06 December 2012
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XIV, 232
Topics: Circuits and Systems, Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design