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Table of contents (13 chapters)
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Test Planning, Access and Scheduling
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Interconnect, Crosstalk and Signal Integrity
Keywords
About this book
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity.
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Editors and Affiliations
Bibliographic Information
Book Title: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
Editors: Krishnendu Chakrabarty
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4757-6527-4
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2002
Hardcover ISBN: 978-1-4020-7205-5Published: 30 September 2002
Softcover ISBN: 978-1-4419-5307-0Published: 12 December 2011
eBook ISBN: 978-1-4757-6527-4Published: 17 April 2013
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: VIII, 200
Additional Information: Reprinted from JOURNAL OF ELECTRONIC TESTING, 18:4-5
Topics: Circuits and Systems, Electrical Engineering, Computer-Aided Engineering (CAD, CAE) and Design