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Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

  • Book
  • © 2008

Overview

Editors:
  1. Mohammad Tehranipoor

    1. Department of Electrical and Computer Engineering, University of Connecticut, Storrs, USA

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  • Covers various technologies that have been suggested by researchers over the last decades
  • Includes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubes
  • Discusses different aspects of test and defect tolerance for crossbar-based nanoscale devices
  • Contains five chapters focusing on test, defect tolerance and reliability for QCA circuits
  • Presents methods for testing and diagnosis of realistic defects in digital microfluidic biochips
  • Includes three chapters dealing with the reliability of CMOS scale devices, developing nanoscale processors and future molecular electronics-based circuits
  • Includes supplementary material: sn.pub/extras

Part of the book series: Frontiers in Electronic Testing (FRET, volume 37)

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Table of contents (14 chapters)

  1. Front Matter

    Pages IX-X
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  2. Test and Defect Tolerance for Crossbar-Based Architectures

    1. Front Matter

      Pages 1-3
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    2. Defect-Tolerant Logic with Nanoscale Crossbar Circuits

      • T. Hogg, G. Snider
      Pages 5-32

    3. Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics

      • Z. Wang, K. Chakrabarty
      Pages 33-61

    4. Test and Defect Tolerance for Reconfigurable Nanoscale Devices

      • M. Tehranipoor, R. Rad
      Pages 63-93

    5. A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology

      • J. G. Brown, R. D. (Shawn) Blanton
      Pages 95-120

    6. Defect Tolerance in Crossbar Array Nano-Architectures

      • M. B. Tahoori
      Pages 121-151

  3. Test and Defect Tolerance for QCA Circuits

    1. Front Matter

      Pages 153-155
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    2. Reversible and Testable Circuits for Molecular QCA Design

      • X. Ma, J. Huang, C. Metra, F. Lombardi
      Pages 157-202

    3. Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems

      • J. Di, P. K. Lala
      Pages 203-226

    4. QCA Circuits for Robust Coplanar Crossing

      • S. Bhanja, M. Ottavi, S. Pontarelli, F. Lombardi
      Pages 227-249

    5. Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata

      • M. Liu, C. S. Lent
      Pages 251-263

  4. Testing Microfluidic Biochips

    1. Front Matter

      Pages 265-265
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    2. Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems

      • F. Su, S. Ozev, K. Chakrabarty
      Pages 267-286

    3. Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips

      • F. Su, W. Hwang, A. Mukherjee, K. Chakrabarty
      Pages 287-312

  5. Reliability for Nanotechnology Devices

    1. Front Matter

      Pages 313-314
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    2. Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields

      • K. Nepal, R. I. Bahar, J. Mundy, W. R. Patterson, A. Zaslavsky
      Pages 315-338

    3. Towards Nanoelectronics Processor Architectures

      • W. Rao, A. Orailoglu, R. Karri
      Pages 339-372

    4. Design and Analysis of Fault-Tolerant Molecular Computing Systems

      • D. Bhaduri, S. K. Shukla, H. Quinn, P. Graham, M. Gokhale
      Pages 373-397

  6. Back Matter

    Pages 399-408
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Keywords

About this book

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Editors and Affiliations

  • Department of Electrical and Computer Engineering, University of Connecticut, Storrs, USA

    Mohammad Tehranipoor

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