Overview
Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 663)
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Table of contents (10 chapters)
Keywords
About this book
- Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc.
- ESD failure analysis, protection devices, and protection of sub-circuits
- Whole-chip ESD protection and ESD-to-circuit interactions
- Advanced low-parasitic compact ESD protection structures for RF and mixed-signal IC's
- Mixed-mode ESD simulation-design methodologies for design prediction ESD-to-circuit interactions, and more!
Authors and Affiliations
About the author
Bibliographic Information
Book Title: On-Chip ESD Protection for Integrated Circuits
Book Subtitle: An IC Design Perspective
Authors: Albert Z. H. Wang
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/b117005
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2002
Hardcover ISBN: 978-0-7923-7647-7Published: 31 January 2002
Softcover ISBN: 978-1-4757-7574-7Published: 23 March 2013
eBook ISBN: 978-0-306-47618-1Published: 03 January 2006
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XVI, 303