Transmission Electron Microscopy

1. Front Matter

   Pages i-xxxiii

   PDF

2. Electron Sources

   • Pieter Kruit

   Pages 1-15

3. In Situ and Operando

   • Katherine Jungjohann, C. Barry Carter

   Pages 17-80

4. Electron Diffraction and Phase Identification

   • M. Grace Burke

   Pages 81-102

5. Convergent-Beam Electron Diffraction: Symmetry & Large-Aangle Patterns

   • Alwyn Eades

   Pages 103-144

6. Electron Crystallography, Charge-Density Mapping and Nanodiffraction

   • John Spence

   Pages 145-166

7. Digital Micrograph

   • Bernhard Schaffer

   Pages 167-196

8. Electron Waves, Interference & Coherence

   • Michael Lehmann, Hannes Lichte

   Pages 197-214

9. Electron Holography

   • Michael Lehmann, Hannes Lichte

   Pages 215-232

10. Focal-Series Reconstruction

    • Andreas Thust

    Pages 233-266

11. Direct Methods for Images Interpretation

    • Dirk Van Dyck, Sandra Van Aert

    Pages 267-281

12. Imaging in the STEM

    • Stephen J. Pennycook

    Pages 283-342

13. Electron Tomography

    • Matthew Weyland, Paul Midgley

    Pages 343-376

14. EFTEM

    • Paul Thomas, Paul Midgley

    Pages 377-404

15. Calculating EELS

    • Vicki Keast

    Pages 405-423

16. Diffraction & X-Ray Excitation

    • Ian Jones

    Pages 425-437

17. X-Ray and EELS Imaging

    • Paul Kotula

    Pages 439-466

18. Practical Aspects and Advanced Applications of XEDS

    • Masashi Watanabe

    Pages 467-503

19. Back Matter

    Pages 505-518

    PDF

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

• EELS
• EFTEM
• Electron Diffraction
• Electron Holography
• Electron Sources
• Electron Tomography
• Focal-series reconstruction
• Operando TEM
• Spectrum Imaging
• TEM Textbook
• Transmission Electron Microscopy
• XEDS

“I would highly recommend this ‘companion’ volume for researchers and students of the materials and applied sciences; in fact, anybody using transmission electron microscopy in their research will extract many practical ideas … . Because of the high quality of the photographic images, composite illustrations, and text presentations, I suggest that this book has a place on the shelf of any electron microscopy laboratory. … The editors have put together a wonderful review volume that is well worth the read.” (David C. Bell, Microscopy and Microanalysis, Vol. 24 (03), June, 2018)



“Transmission Electron Microscopy, a Textbook for Materials Science, first published in 1996 with a second edition in 2009, is a comprehensive book on the subject, with a quite original approach. … The book was carefully designed for teaching purposes and its phenomenal success shows that this was time well spent.” (Peter Hawkes, Journal of Materials Science, Vol. 52, 2017)

• University of Connecticut, Storrs, USA

  C. Barry Carter

• Ohio State University, Columbus, USA

  David B. Williams

C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.

David B. Williams is the Monte Ahuja Endowed Dean’s Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.

Policies and ethics