Overview
- Nominated as an outstanding Ph.D.thesis by Lancaster University and University of Manchester, UK
- Includes high-resolution computer-generated imagery (CGI) and diagrams to aid understanding and visualization of the research
- Presents the unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials
- Offers an in-depth theoretical analysis backed up with experimental data for a comprehensive overview of the current state of the art in applying scanning probe microscopy to study 2D materials
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Theses (Springer Theses)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (8 chapters)
Keywords
About this book
This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization. The isolation of graphene and, shortly after, a host of other 2D materials has attracted a great deal of interest in the scientific community for both their range of extremely desirable and their record-breaking properties. Amongst these properties are some of the highest elastic moduli and tensile strengths ever observed in nature. The work, which was undertaken at Lancaster University’s Physics department in conjunction with the University of Manchester and the National Physical Laboratory, offers a new approach to understanding the nanomechanical and nanoelectromechanical properties of 2D materials by utilising the nanoscale and nanosecond resolution of ultrasonic force and heterodyne force microscopy (UFM and HFM) – both contact mode atomic force microscopy (AFM) techniques. Using this approach and developing several other new techniques the authors succeeded in probing samples’ subsurface and mechanical properties, which would otherwise remain hidden. Lastly, by using a new technique, coined electrostatic heterodyne force microscopy (E-HFM), the authors were able to observe nanoscale electromechanical vibrations with a nanometre and nanosecond resolution, in addition to probing the local electrostatic environment of devices fabricated from 2D materials.
Authors and Affiliations
About the author
Â
Bibliographic Information
Book Title: Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals
Book Subtitle: A Scanning Probe Microscopy Approach
Authors: Nicholas D. Kay
Series Title: Springer Theses
DOI: https://doi.org/10.1007/978-3-319-70181-3
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer International Publishing AG 2018
Hardcover ISBN: 978-3-319-70180-6Published: 07 December 2017
Softcover ISBN: 978-3-319-88898-9Published: 04 September 2018
eBook ISBN: 978-3-319-70181-3Published: 27 November 2017
Series ISSN: 2190-5053
Series E-ISSN: 2190-5061
Edition Number: 1
Number of Pages: XXI, 122
Number of Illustrations: 53 b/w illustrations, 14 illustrations in colour
Topics: Surface and Interface Science, Thin Films, Nanotechnology, Spectroscopy and Microscopy, Nanoscale Science and Technology