Editors

Editor-in-Chief:

S.Y. Kung
Dept. of Electrical Engineering, Princeton University, NJ, USA

Co-Editor-in-Chief:

Jarmo Takala
Tampere University, Finland 

John McAllister
Queen's University Belfast
 

Editorial Board:

Tülay Adali, University of Maryland, Baltimore County, USA
Kubilay Atasu, IBM Zurich Research Laboratory, Switzerland
Oscar Au, Hong Kong University of Science and Technology, Hong Kong 
Neal Bambha, US Army Research Laboratory, USA
Magdy A. Bayoumi, University of Louisiana at Lafayette, USA 
Shuvra Bhattacharyya, University of Maryland, USA
Holger Blume, Leibniz Universität Hannover, Germany
Jani Boutellier, University of Vaasa, Finland
Andreas Burg, EPFL, Switzerland
Wayne Burleson, University of Massachusetts, USA
Francky Catthoor, Katholieke Universiteit Leuven/IMEC, Belgium
Joseph Cavallaro, Rice University, USA 
Chaitali Chakrabarti, Arizona State University, USA 
S.C. Chan, University of Hong Kong, Hong Kong 
Nitin Chandrachoodan, Indian Institute of Technology, Madras, India
Rong Chen, University of Maryland, Baltimore County, USA
Liang-Gee Chen, National Taiwan University, Taiwan 
Sao-Jie Chen, National Taiwan University, Taiwan
Xiaoheng Chen, SanDisk Corporation, USA 
Yen-Kuang Chen, Intel Corporation, USA 
Albert M. K. Cheng, University of Houston, USA
Xiaochun Cheng, Swansea University, UK
Jen-Tzung Chien, National Chiao Tung University, Taiwan 
Ching-Te Chiu, National Tsing Hua University, Taiwan 
Konstantinos I. Diamantaras, Aristotle University of Thessaloniki, Greece 
Brian L. Evans, University of Texas at Austin, USA 
Lin Feng, Nanyang Technological University, Singapore 
Mario Garrido, Linköping University, Sweden
Xiaodong Gu, Fudan University, China
Ling Guan, Ryerson Polytechnic University, Canada 
Yun He, Tsinghua University, China
Yo-Sung Ho, Gwangju Institute of Science and Technology, Republic of Korea 
Sangjin Hong, State University of New York at Stony Brook, USA
Y.H. Hu, University of Wisconsin, USA 
Mohammad Ibrahim, De Montfort University, UK
Jack Jean, Wright State University, USA 
Y.C. Jenq, Portland State University, USA 
Hiroshi Kawaguchi, Kobe University, Japan 
Changick Kim, KAIST, Republic of Korea 
Branislav Kisacanin, Interphase, USA 
Shang-Hong Lai, National Tsing Hua University, Taiwan 
Gwo Lee, National Cheng Kung University, Taiwan 
Eung-Joo Lee, University of Arizona, USA 
Paul P. K. Lee, ITT Corp, USA 
Ta-Sung Lee, National Chiao Tung University, Taiwan
Shipeng Li, iFLYTEK Co. Ltd., China  
Zhu Li, University of Missouri-Kansas City, USA 
Chang Hong Lin, National Taiwan University of Science and Technology, Taiwan 
Wayne Luk, Imperial College London, UK
Man Wai Mak, Hong Kong Polytechnic University, Hong Kong 
Elias Manolakos, University of Athens, Greece 
John McAllister, Queen's University Belfast, UK
David J. Miller, Pennsylvania State University, USA 
Jean-François Nezan, INSA de Rennes, France 
Amos R. Omondi, SUNY Korea, Republic of Korea
Francesca Palumbo, University of Sassari, Italy
Keshab K. Parhi, University of Minnesota, USA 
Guillermo Payá Vayá, Leibniz Universität Hannover, Germany 
Maxime Pelcat, IETR, France; INSA de Rennes, France  
Andy D. Pimentel, University of Amsterdam, Netherlands 
Meikang Qiu, Texas A&M University, USA
Michael Schulte, University of Wisconsin-Madison, USA 
Edwin Sha, University of Notre Dame, USA 
Olli Silven, University of Oulu, Finland 
Wan Chi Siu, Hong Kong Polytechnic University, Hong Kong 
Ming Ting Sun, University of Washington, USA 
Earl E. Swartzlander, Jr., University of Texas, Austin, USA 
Yap-Peng Tan, Nanyang Technological University, Singapore 
Lothar Thiele, Swiss Federal Institute of Technology, Switzerland;
Pei-Yun Tsai, National Central University, Taiwan 
Senem Velipasalar, Syracuse University, USA 
Chua-Chin Wang, National Sun Yat-Sen University, Taiwan 
Jiangtao Wen, Tsinghua University, China 
Roger Woods, Queen's University of Belfast, UK 
An-Yeu Wu, National Taiwan University, Taiwan 
Zhiyuan Yan, Lehigh University, USA 
Kung Yao, UCLA, USA 
Kim Hui Yap, Nanyang Technological University, Singapore
Chang D. Yoo, KAIST, Republic of Korea
Bo Yuan, Rutgers University, USA
Qian Zhang, Hong Kong University of Science and Technology, Hong Kong 
Tong Zhang, Rensselaer Polytechnic Institute, USA 
Karl-Heinz Zimmermann, Technical University of Hamburg-Harburg, Germany

Area Editor: Big Data Security Track
Meikang Qiu, Texas A&M University, USA