Skip to main content
SpringerLink
Log in
Book cover

Fringe 2013

7th International Workshop on Advanced Optical Imaging and Metrology

  • Conference proceedings
  • © 2014

Overview

Editors:
  1. Wolfgang Osten

    1. Universität Stuttgart Inst. Technische Optik, Stuttgart, Germany

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  • A comprehensive overview about the state of the art in modern optical imaging and metrology
  • Written by the world leading experts in the field
  • Combination of two disciplines: metrology and imaging

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 259.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 329.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 329.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (181 papers)

  1. Front Matter

    Pages 1-24
    Download chapter PDF

  2. Honorary Lecture: Holography Viewed from the Perspective of the Light Field Camera

    1. Front Matter

      Pages 1-1
      Download chapter PDF

    2. Holography Viewed from the Perspective of the Light Field Camera

      • Joseph W. Goodman
      Pages 3-15

    3. Invisibility, Perfect Imaging and More – Where Optics Meets Magic

      • Tomáš Tyc
      Pages 17-22

  3. Topic 1: New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Imaging and Metrology

    1. Front Matter

      Pages 23-23
      Download chapter PDF

    2. Fourier Modal Method and Its Applications to Inverse Diffraction, Near-Field Imaging, and Nonlinear Optics

      • Jari Turunen, Jani Tervo
      Pages 25-33

    3. The Road towards Accurate Optical Width Measurements at the Industrial Level

      • Bernd Bodermann, Rainer Köning, Detlef Bergmann, Wolfgang Häßler-Grohne, Jens Flügge, Harald Bosse
      Pages 35-41

    4. Lowering the Cross Correlation between Different Shape Parameters of the Inverse Grating Problem in Coherent Fourier Scatterometry

      • S. Roy, N. Kumar, S. F. Pereira, H. P. Urbach
      Pages 43-48

    5. Fast Geometric Characterization of Gold Nanorod Ensembles Based on Inverse Scattering Spectroscopy

      • Ninghan Xu, Benfeng Bai, Qiaofeng Tan, Guofan Jin
      Pages 49-55

    6. Engineering Harmonic Content in Diffractive Optical Elements

      • Ignacio Moreno, Jorge Albero, Jeffrey A. Davis, Don M. Cottrell
      Pages 57-62

    7. Linear Theory of Optical Surface Measuring Instruments

      • Jeremy Coupland
      Pages 63-70

    8. Quasi Ellipse Method Enabling High Accuracy Phase Reconstruction with Random Phase Steps in Fizeau-Interferometers

      • Michael F. Küchel
      Pages 71-86

    9. Measurement of Aspheres and Free-Form Surfaces with the Tilted-Wave-Interferometer

      • Goran Bastian Baer, Johannes Schindler, Christof Pruss, Wolfgang Osten
      Pages 87-95

    10. Correction of Errors in Polarization Based Dynamic Phase Shifting Interferometers

      • Bradley Kimbrough
      Pages 97-102

    11. Single Shot Shape Evaluation Using Dual-Wavelength Holographic Reconstructions and Regularization

      • Per Bergström, Davood Khodadad, Emil Hällstig, Mikael Sjödahl
      Pages 103-108

    12. Compressive Imaging and Spectroscopy – Beyond the Single Pixel Camera

      • Ting Sun, Yun Li, Lina Xu, Kevin F. Kelly
      Pages 109-115

    13. Wave-Optical Reconstruction of Plenoptic Camera Images

      • André Junker, Tim Stenau, Karl-Heinz Brenner
      Pages 117-122

    14. Iterative Phase Retrieval and the Important Role Played by Initial Conditions

      • Lysann Megel, Damien P. Kelly, Thomas Meinecke, Stefan Sinzinger
      Pages 123-128

    15. High Precision Single Beam Phase Retrieval Techniques

      • Konstantinos Falaggis, Tomasz Kozacki, Malgorzata Kujawińska, Michał Józwik, Arkadiusz Kuś
      Pages 129-135

    16. Comparison of Digital Holography and Transport of Intensity for Quantitative Phase Contrast Imaging

      • Chao Zuo, Qian Chen, Anand Asundi
      Pages 137-142
Back to top

Keywords

About this book

In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are:
- New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution)
- Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time)
- High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano)
- Hybrid technologies in Optical Imaging and Metrology
(hybrid optics, sensor and data fusion, model-based solutions,multimodality)
- New optical sensors, imaging and measurement systems
(integrated, miniaturized, in-line, real-time, traceable, remote)

Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.

Editors and Affiliations

  • Universität Stuttgart Inst. Technische Optik, Stuttgart, Germany

    Wolfgang Osten

About the editor

Prof Dr. Wolfgang Osten is head of the Institute of Technical Optics

Bibliographic Information

Publish with us

Policies and ethics

Back to top

Search

Navigation