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Engineering - Electronics & Electrical Engineering | Journal of Electronic Testing - incl. option to publish open access (Editorial Board)

Journal of Electronic Testing

Journal of Electronic Testing

Theory and Applications

Main editor: Vishwani Agrawal

ISSN: 0923-8174 (print version)
ISSN: 1573-0727 (electronic version)

Journal no. 10836

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Vishwani Agrawal
Auburn University

Magdy S. Abadir
Freescale Semiconductors, Austin, Texas
Jacob A. Abraham
University of Texas at Austin
Bashir M. Al-Hashimi
University of Southampton
Bhargab B. Bhattacharya
Indian Statistical Institute, Kolkata, India
Melvin A. Breuer
University of Southern California
Michael L. Bushnell
Rutgers University
Krishnendu Chakrabarty
Duke University
Srimat T. Chakradhar
Victor Champac
National Institute of Astrophysics, Optics and Electronics, Mexico
Kwang-Ting Cheng
U. of California at Santa Barbara
Sêrge Demidenko
Monash University Sunway Campus, Malaysia
Joan Figueras
Universitat Politechnica de Catalunya, Spain
Patrick Girard
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Dimitris Gizopoulos
University of Piraeus
Michael Goessel
University of Potsdam, Germany
John P. Hayes
University of Michigan
Sybille Hellebrand
University of Paderborn, Germany
Michael S. Hsiao
Virginia Tech
André Ivanov
University of British Columbia, Canada
Seiji Kajihara
Kyushu Inst. of Technology, Japan
Bruce Kim
University of Alabama
Christian Landrault
LIRMM, France
Kuen-Jong Lee
National Cheng Kung University, Taiwan
Xiaowei Li
Institute of Computer Technology, China
Yiorgos Makris
University of Texas at Dallas, Texas, USA
Martin Margala
University of Massachusetts Lowell
Erik Jan Marinissen
IMEC, Belgium
Cecilia Metra
University of Bologna, Italy
Salvador Mir
TIMA Laboratory, France
Subhasish Mitra
Stanford University, USA
Nicola Nicolici
McMaster University
Alex Orailoglu
University of California, San Diego
Christos A. Papachristou
Case Western Reserve University
Rubin A. Parekhji
Texas Instruments (India)
C. P. Ravikumar
Texas Instruments India Ltd.
Michel Renovell
LIRMM, France
Manoj Sachdev
University of Waterloo
Kewal K. Saluja
University of Wisconsin
John W. Sheppard
Ozgur Sinanoglu
New York University Abu Dhabi, Abu Dhabi
Adit D. Singh
Auburn University
Mani Soma
University of Washington
Matteo Sonza Reorda
Politecnico di Torino, Italy
Stephen K. Sunter
Mentor Graphics (Canada)
Mohammad Tehranipoor
University of Connecticut
Theocharis (Theo) Theocharides
University of Cyprus
Nur Touba
University of Texas at Austin
Xiaoqing Wen
Kyushu Institute of Technology, Japan
Cheng-Wen Wu
National Tsing Hua University, Hsinchu, Taiwan
Hans-Joachim Wunderlich
University of Stuttgart, Germany
Tian Xia
University of Vermont, USA
Yervant Zorian
Virage Logic

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For authors and editors

  • Journal Citation Reports®
    2016 Impact Factor
  • 0.647
  • Aims and Scope

    Aims and Scope


    The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

    Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:

    Testing of VLSI devices printed circuit boards, and electronic systems;
    Testing of analog and digital electronic circuits
    Testing of microprocessors, memories, and signal processing devices;
    Fault modeling;
    Test generation;
    Fault simulation;
    Testability analysis;
    Design for testability
    Synthesis for testability;
    Built-in self-test;
    Test specification;
    Fault tolerance;
    Formal verification of hardware;
    Simulation for verification;
    Design debugging
    AI methods and expert systems for test and diagnosis
    Automatic test equipment (ATE);
    Test fixtures
    Electron Beam Test Systems;
    Test programming;
    Test data analysis;
    Economics of testing;
    Quality and reliability
    CAD Tools;
    Testing of wafer-scale integration devices
    Testing of reliable systems;
    Manufacturing yield and design for yield improvement;
    Failure mode analysis and process improvement.

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