Overview
- Relates CMOS product performance to basic physical models of transistors and passive elements
- Uses embedded test structures and sensors for product test debug, yield and performance evaluation
- Describes impact of device variability
- Discusses application corners, schmooing and product specifications including guardbands
- Presents an overall view of CMOS product chip test, test equipment and diagnostic tools
- Describes data analysis techniques for rapid evaluation and debug during test
- Features nearly 300 illustrations
- Includes supplementary material: sn.pub/extras
- Request lecturer material: sn.pub/lecturer-material
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Table of contents (10 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Authors and Affiliations
About the authors
Manjul Bhushan is a technical consultant in New York.
Mark Ketchen is a technical consultant in Massachusetts.
Bibliographic Information
Book Title: CMOS Test and Evaluation
Book Subtitle: A Physical Perspective
Authors: Manjul Bhushan, Mark B. Ketchen
DOI: https://doi.org/10.1007/978-1-4939-1349-7
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media New York 2015
Hardcover ISBN: 978-1-4939-1348-0
Softcover ISBN: 978-1-4939-4702-7
eBook ISBN: 978-1-4939-1349-7
Edition Number: 1
Number of Pages: XIII, 424
Number of Illustrations: 338 b/w illustrations
Topics: Electronics and Microelectronics, Instrumentation, Circuits and Systems, Semiconductors, Quality Control, Reliability, Safety and Risk