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Table of contents(8 chapters)
About this book
Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives.
Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field.
`A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.'
... from the Foreword by Vishwani D. Agrawal
Authors and Affiliations
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Philips Research, The Netherlands
Manoj Sachdev
Bibliographic Information
Book Title: Defect Oriented Testing for CMOS Analog and Digital Circuits
Authors: Manoj Sachdev
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4757-4926-7
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media Dordrecht 1999
eBook ISBN: 978-1-4757-4926-7Published: 29 June 2013
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XIV, 308
Number of Illustrations: 78 b/w illustrations
Topics: Electrical Engineering, Engineering Design