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Defect Oriented Testing for CMOS Analog and Digital Circuits

  • Book
  • © 1999

Overview

Authors:
  1. Manoj Sachdev

    1. Philips Research, The Netherlands

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Part of the book series: Frontiers in Electronic Testing (FRET, volume 10)

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Table of contents (8 chapters)

  1. Front Matter

    Pages i-xiv
    Download chapter PDF

  2. Introduction

    • Manoj Sachdev
    Pages 1-14

  3. Digital CMOS Fault Modeling and Inductive Fault Analysis

    • Manoj Sachdev
    Pages 15-63

  4. Defects in Logic Circuits and Their Test Implications

    • Manoj Sachdev
    Pages 65-94

  5. Testing Defects in Sequential Circuits

    • Manoj Sachdev
    Pages 95-132

  6. Defect Oriented RAM Testing and Current Testable RAMs

    • Manoj Sachdev
    Pages 133-204

  7. Testing Defects in Programmable Logic Circuits

    • Manoj Sachdev
    Pages 205-241

  8. Defect Oriented Analog Testing

    • Manoj Sachdev
    Pages 243-296

  9. Conclusion

    • Manoj Sachdev
    Pages 297-303

  10. Back Matter

    Pages 305-308
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Keywords

About this book

Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate.
Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives.
Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field.

`A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.'
... from the Foreword by Vishwani D. Agrawal

Authors and Affiliations

  • Philips Research, The Netherlands

    Manoj Sachdev

Bibliographic Information

  • Book Title: Defect Oriented Testing for CMOS Analog and Digital Circuits

  • Authors: Manoj Sachdev

  • Series Title: Frontiers in Electronic Testing

  • DOI: https://doi.org/10.1007/978-1-4757-4926-7

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media Dordrecht 1999

  • eBook ISBN: 978-1-4757-4926-7Published: 29 June 2013

  • Series ISSN: 0929-1296

  • Edition Number: 1

  • Number of Pages: XIV, 308

  • Number of Illustrations: 78 b/w illustrations

  • Topics: Electrical Engineering, Engineering Design

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