Skip to main content
SpringerLink
Log in

Life-Cycle Assessment of Semiconductors

  • Book
  • © 2012

Overview

Authors:
  1. Sarah B. Boyd

    1. Pe Americas, LLC, Boston, USA

    View author publications

    You can also search for this author in PubMed   Google Scholar

  • Provides a detailed, complete and transparent life cycle assessment of semiconductor logic and memory devices
  • Offers thorough evaluations of many technology generations of semiconductor logic and memory
  • Contains an overview of environmentally significant trends in the semiconductor industry
  • Includes supplementary material: sn.pub/extras

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (8 chapters)

  1. Front Matter

    Pages i-xxvii
    Download chapter PDF

  2. Introduction

    • Sarah B. Boyd
    Pages 1-12

  3. Semiconductor LCI Methods

    • Sarah B. Boyd
    Pages 13-26

  4. Semiconductor Manufacturing Trends in Product Type and Geography

    • Sarah B. Boyd
    Pages 27-35

  5. Life-Cycle Energy and Global Warming Emissions of CMOS Logic

    • Sarah B. Boyd
    Pages 37-68

  6. Life-Cycle Assessment of CMOS Logic

    • Sarah B. Boyd
    Pages 69-86

  7. Life-Cycle Assessment of Flash Memory

    • Sarah B. Boyd
    Pages 87-96

  8. Life-Cycle Assessment of Dynamic Random Access Memory

    • Sarah B. Boyd
    Pages 97-107

  9. Semiconductor LCA: The Road Ahead

    • Sarah B. Boyd
    Pages 109-112

  10. Back Matter

    Pages 113-226
    Download chapter PDF
Back to top

Keywords

About this book

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.

Authors and Affiliations

  • Pe Americas, LLC, Boston, USA

    Sarah B. Boyd

Bibliographic Information

Publish with us

Policies and ethics

Back to top

Search

Navigation