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Engineering - Electronics & Electrical Engineering | New Methods of Concurrent Checking

New Methods of Concurrent Checking

Gössel, M., Ocheretny, V., Sogomonyan, E., Marienfeld, D.

2008, VIII, 182 p.

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  • Of great importance for the emerging nanotechnologies with their increasing numbers of transient faults
  • Shows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designed
  • The only book which describes the most important methods of concurrent checking developed in the last 15 years
  • The only book which contains a detailed description of the best possible error detection circuits for all types of adders
  • Shows for the first time how soft-error correction can be combined with concurrent checking

New Methods of Concurrent Checking is the ultimate reference to answer the question as to how the best possible state-of-the-art error detection circuits can be designed. The most effective methods of concurrent checking for digital circuits are comprehensively described which were developed in the last 15 years. Some of the methods are published for the first time. How concurrent checking can be combined with soft error correction is also shown for the first time. This book is invaluable in considering the design of reliable systems in the emerging Nanotechnologies with an associated growing number of transient faults.

Written by a team of two leading experts and two very successful young former PhD students, New Methods of Concurrent Checking describes new methods of concurrent checking, such as partial duplication, use of output dependencies, complementary circuits, self-dual parity, self-dual duplication and others. A special chapter demonstrates how the new general methods of concurrent checking can be more specifically applied to regular structures to obtain optimum results. This is exemplified for all types of adders up to 64 bits with a level of detail never before presented in the literature. The clearly written text is illustrated by about 100 figures.

New Methods of Concurrent Checking is approved in many university courses for graduate and undergraduate students, and it is of interest to students and teachers in electrical engineering and computer science, researchers and designers and all readers who are interested in the design and the understanding of reliable circuits and computers.

Content Level » Research

Keywords » CMOS - Computer - Concurrent Checking - Reliability for Nanotechnologies - Self-Checking Adders - Self-Checking Circuits - Soft Error Detection and Correction - computer science

Related subjects » Circuits & Systems - Electronics & Electrical Engineering - Theoretical Computer Science

Table of contents 

1 Introduction. 2 Physical Faults and Functional Errors. 2.1 Stuck-at Faults. 2.2 Bridging Faults. 2.3 CMOS Stuck-open and Stuck-on Faults. 2.4 Delay Faults. 2.5 Transient Faults. 2.6 Functional Error Model. 2.7 Output Dependencies. 2.8 Self-Testing and Self-Checking. 2.9 Faults and Errors in Submicron Technologies. 3 Principles of Concurrent Checking. 3.1 Duplication and Comparison. 3.2 Block Codes for Error Detection. 3.3 Parity and Group Parity Checking. 3.4 Odd and Even Error Detection. 3.5 Code-Disjoint Circuits. 3.6 Error Detection by Complementary Circuits. 3.7 General Method for the Design of Error Detection Circuits. 3.8 Self-Dual Error Detection. 3.9. Error Detection with Soft Error Correction. 4. Concurrent Checking for the Adders. 4.1 Basic Types of Adders. 4.2 Parity Checking for Adders. 4.3 Self-Checking Adders. References. Index.

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