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  • © 2006

Oscillation-Based Test in Mixed-Signal Circuits

Part of the book series: Frontiers in Electronic Testing (FRET, volume 36)

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Table of contents (7 chapters)

  1. Front Matter

    Pages I-XV
  2. Oscillation-Based Test Methodology

    • Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 1-48
  3. Mathematical Review of Non-linear Oscillators

    • Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 49-95
  4. OBT Methodology for Discrete-Time Filters

    • Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 97-156
  5. OBT Methodology for discrete-time ΣΔ Modulators

    • Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 157-203
  6. OBT Implementation in Discrete-Time Filters

    • Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 205-231
  7. Practical regards for OBT-OBIST implementation

    • Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 233-295
  8. OBT-OBIST silicon validation

    • Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz
    Pages 297-358
  9. Back Matter

    Pages 359-452

About this book

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Authors and Affiliations

  • IMSE-CNM CSIC-Universidad de Sevilla, Spain

    Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz

About the authors

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.

Bibliographic Information

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access