Authors:
- Covers the entire spectrum of clocked, regenerative comparators
- Provides methods and measurement circuits for the characterization of advanced comparators and nanometer CMOS devices
- Advanced measurement circuits for characterization of devices introduced
- Outstanding graphical quality of the illustrations
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Advanced Microelectronics (MICROELECTR., volume 50)
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Table of contents (8 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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Microwave and Circuit Engineering (EMCE), TU, Institute of Electrodynamics,, Wien, Austria
Bernhard Goll
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Microwave and Circuit Engineering (EMCE), TU,, Institute of Electrodynamics, Wien, Austria
Horst Zimmermann
Bibliographic Information
Book Title: Comparators in Nanometer CMOS Technology
Authors: Bernhard Goll, Horst Zimmermann
Series Title: Springer Series in Advanced Microelectronics
DOI: https://doi.org/10.1007/978-3-662-44482-5
Publisher: Springer Berlin, Heidelberg
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2015
Hardcover ISBN: 978-3-662-44481-8Published: 25 September 2014
Softcover ISBN: 978-3-662-52023-9Published: 23 August 2016
eBook ISBN: 978-3-662-44482-5Published: 15 September 2014
Series ISSN: 1437-0387
Series E-ISSN: 2197-6643
Edition Number: 1
Number of Pages: XIV, 250
Number of Illustrations: 180 b/w illustrations, 37 illustrations in colour
Topics: Circuits and Systems, Nuclear Physics, Heavy Ions, Hadrons, Nanotechnology and Microengineering, Electronics and Microelectronics, Instrumentation, Characterization and Evaluation of Materials