Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits
Yu, Wenjian, Wang, Xiren
Jointly published with Tsinghua University Press, Beijing, China
2014, XV, 246 p. 104 illus.
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The first book on exposing the technical details of various 3-D field solvers for RC extraction
Challenging issues faced by the capacitance extraction under nanometer technology are covered with the state-of-the-art techniques
The direct boundary element method is comprehensively introduced as an efficient modeling technique for interconnect and substrate structures with arbitrary dielectric configurations
Several techniques discussed have been broadly used in IC industry for RC extraction
Practical examples and over 60 illustrations
Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm.
This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries.
Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA.
Content Level »Research
Keywords »Boundary Element Method - Computer-aided Design of Integrated Circuits - Field Solver Algorithms - Parasitic Extraction