Nyquist AD Converters, Sensor Interfaces, and Robustness
Advances in Analog Circuit Design, 2012
van Roermund, Arthur, Baschirotto, Andrea, Steyaert, Michiel (Eds.)
2013, X, 294 p.
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Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia
Presents material in a tutorial-based format
Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.
Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;
Presents material in a tutorial-based format;
Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
Content Level »Research
Keywords »Analog Circuit Design - Analog to Digital Converters - CMOS ADCs - CMOS Connectivity - CMOS Reliability - CMOS Variability - Capacitive Sensor Interfaces - Nyquist A/D Converters
Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.