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Engineering - Circuits & Systems | Circuit Design for Reliability

Circuit Design for Reliability

Reis, Ricardo, Cao, Yu, Wirth, Gilson (Eds.)

2015, VI, 272 p. 190 illus., 132 illus. in color.

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  • Provides comprehensive review on various reliability mechanisms at sub-45nm nodes
  • Describes practical modeling and characterization techniques for reliability
  • Includes thorough presentation of robust design techniques for major VLSI design units
  • Promotes physical understanding with first-principle simulations

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

  • Provides comprehensive review on various reliability mechanisms at sub-45nm nodes;
  • Describes practical modeling and characterization techniques for reliability;
  • Includes thorough presentation of robust design techniques for major VLSI design units;
  • Promotes physical understanding with first-principle simulations.

Content Level » Research

Keywords » Embedded Systems - Integrated Circuit Design - Integrated Circuit Variability - Reliable Integrated Circuits - Robust Integrated Circuits

Related subjects » Circuits & Systems - Information Systems and Applications - Production & Process Engineering

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Distribution rights for India: Delhi Book Store, New Delhi, India

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