Low Power and Process Variation Aware SRAM and Cache Design
Sasan, Avesta, Kurdahi, Fadi, Eltawil, Ahmed
2015, 200 p. 100 illus.
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Describes a variety of design solutions for voltage scalable SRAM/Cache architectures with reliability tolerance to process variation
Explains cross layer voltage and power management, enabling system level awareness of manufacturing defects and circuit/architectural mitigation techniques
Includes techniques for building fault free system using faulty components/memories
Explores tradeoffs between power consumption, area, reliabality and performance in nano region memory design
This book addresses process variability and power management for embedded memories, which are becoming dominant components in today’s Systems on Chip (SoCs). It provides thorough background on voltage scaling and the reliability effects on memories, while describing memory behavior at different voltages and frequencies. The authors describe a cross-layer approach, simultaneously targeting the manufacturing of devices, the inner-design of the memory circuits, as well as the way they are architected into a system. This approach enables the design of reliable, power-efficient systems in which memories are dominating area, power, and performance.
Content Level »Research
Keywords »Embedded Memory Design - Fault tolerant memory design - Low power memory design - Memory Circuit Design - Process Variation Aware SRAM - SRAM design - System on Chip - Voltage scalable SRAM/Cache architectures