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Provides an overview of the sources for electrical overstress events and also details the conduction mechanisms which lead to damage
Provides a method analysts can use to determine the root cause of the EOS event
Focuses on methods to protect circuit by building EOS robustness into the circuit and providing the appropriate external
EOS protection device to meet the design objectives
This book will provide a broad but detailed view of Electrical Overstress in semiconductor devices, with a focus on integrated circuit and discrete devices. It will equip the reader with the understanding needed to address EOS damage seen in their work environment and help them identify and correct the sources of EOS damage.
Content Level »Research
Keywords »Debugging EOS - EOS - EOS Protection - Electrical Overstress - Integrated Circuits and Systems - Physical Limits of Semiconductors - Robust Circuits - Semiconductor Reliability
Origins of EOS.- EOS/Surge Standards.- Device Physics at EOS Stress Levels.- EOS Induced Damage.- EOS Protection Elements and Their Use.- Debugging EOS Failures.- Designing EOS Robust Circuits.- Evaluation Techniques for EOS Robustness.