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Engineering - Circuits & Systems | Electrical Overstress - The Nemesis of Semiconductor Components

Electrical Overstress

The Nemesis of Semiconductor Components

Vinson, James

2015, 300 p. 80 illus.

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ISBN 978-1-4419-8779-2

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  • About this book

  • Provides an overview of the sources for electrical overstress events and also details the conduction mechanisms which lead to damage 
  • Provides a method analysts can use to determine the root cause of the EOS event 
  • Focuses on methods to protect circuit by building EOS robustness into the circuit and providing the appropriate external
  • EOS protection device to meet the design objectives
This book will provide a broad but detailed view of Electrical Overstress in semiconductor devices, with a focus on integrated circuit and discrete devices. It will equip the reader with the understanding needed to address EOS damage seen in their work environment and help them identify and correct the sources of EOS damage.

Content Level » Research

Keywords » Debugging EOS - EOS - EOS Protection - Electrical Overstress - Integrated Circuits and Systems - Physical Limits of Semiconductors - Robust Circuits - Semiconductor Reliability

Related subjects » Applied & Technical Physics - Circuits & Systems - Production & Process Engineering

Table of contents 

Origins of EOS.- EOS/Surge Standards.- Device Physics at EOS Stress Levels.- EOS Induced Damage.- EOS Protection Elements and Their Use.- Debugging EOS Failures.- Designing EOS Robust Circuits.- Evaluation Techniques for EOS Robustness.

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