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Engineering - Circuits & Systems | Intermittent Failures in Integrated Circuits - Detection, Characterization and Fault Tolerance

Intermittent Failures in Integrated Circuits

Detection, Characterization and Fault Tolerance

Sanyal, Alodeep, Kundu, Sandip, Polian, Ilia

2015, 300 p.

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  • About this book

  • Provides a broad and detailed study of different sources of circuit noise and their impact on reliable circuit operation
  • Describes various methods of characterization and test for intermittent errors
  • Presents various fault tolerance techniques at various layers of abstraction (from transistor to architecture) to ensure reliable circuit operation in presence of intermittent errors

This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.

Content Level » Research

Keywords » Circuits and Systems - Embedded Systems - Fault Tolerance - Intermittent Errors - VLSI Testing

Related subjects » Biotechnology - Circuits & Systems

Table of contents 

Fundamentals of VLSI Testing.- Circuit Marginality and Noise Sources.- Fault Modeling for Intermittent Errors.- Automatic Test Pattern Generation.- Design-for-Testability.- Test Economics and Cost-Benefit Analysis.- Layout Level Fault Tolerance.- Circuit Level Fault Tolerance.- Gate Level Fault Tolerance.- System Level Fault Tolerance.- Information Level Fault Tolerance.

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