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Provides a broad and detailed study of different sources of circuit noise and their impact on reliable circuit operation
Describes various methods of characterization and test for intermittent errors
Presents various fault tolerance techniques at various layers of abstraction (from transistor to architecture) to ensure reliable circuit operation in presence of intermittent errors
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.
Content Level »Research
Keywords »Circuits and Systems - Embedded Systems - Fault Tolerance - Intermittent Errors - VLSI Testing