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Table of contents (11 chapters)
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Front Matter
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Introductory
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Front Matter
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Testing single-port and two-port SRAMs
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Front Matter
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Testing p-port SRAMs
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Front Matter
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Back Matter
About this book
Features:
-Fault primitive based analysis of memory faults,
-A complete framework of and classification memory faults,
-A systematic way to develop optimal and high quality memory test algorithms,
-A systematic way to develop test patterns for any multi-port SRAM,
-Challenges and trends in embedded memory testing.
Reviews
From the reviews:
"Static random access memories (SRAMs) enjoy a strategic position in the microelectronic industry. … This book concentrates on the study of fault modeling, testing and test strategies for SRAMs. … The book provides a well-written coverage in the area of single-, two- and n-port SRAM testing, fault modeling, and simulation. It is well-organized and very timely. … The book promises to make valuable contribution to the education of graduate students … . I highly recommend this book … ." (Mile Stojcev, Microelectronics Reliability, Vol. 45, 2005)
Authors and Affiliations
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Delft University of Technology, The Netherlands
Said Hamdioui
Bibliographic Information
Book Title: Testing Static Random Access Memories
Book Subtitle: Defects, Fault Models and Test Patterns
Authors: Said Hamdioui
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4757-6706-3
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 2004
Hardcover ISBN: 978-1-4020-7752-4Published: 31 March 2004
Softcover ISBN: 978-1-4419-5430-5Published: 09 December 2010
eBook ISBN: 978-1-4757-6706-3Published: 29 June 2013
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XX, 221
Topics: Circuits and Systems, Electrical Engineering, Characterization and Evaluation of Materials, Optical and Electronic Materials