Logo - springer
Slogan - springer

Engineering - Circuits & Systems | Oscillation-Based Test in Mixed-Signal Circuits

Oscillation-Based Test in Mixed-Signal Circuits

Huertas Sánchez, G., Vázquez García de la Vega, D., Rueda Rueda, A., Huertas Díaz, J.L.

2006, XVI, 452 p.

Available Formats:
eBook
Information

Springer eBooks may be purchased by end-customers only and are sold without copy protection (DRM free). Instead, all eBooks include personalized watermarks. This means you can read the Springer eBooks across numerous devices such as Laptops, eReaders, and tablets.

You can pay for Springer eBooks with Visa, Mastercard, American Express or Paypal.

After the purchase you can directly download the eBook file or read it online in our Springer eBook Reader. Furthermore your eBook will be stored in your MySpringer account. So you can always re-download your eBooks.

 
$159.00

(net) price for USA

ISBN 978-1-4020-5315-3

digitally watermarked, no DRM

Included Format: PDF

download immediately after purchase


learn more about Springer eBooks

add to marked items

Hardcover
Information

Hardcover version

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.

 
$209.00

(net) price for USA

ISBN 978-1-4020-5314-6

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days


add to marked items

Softcover
Information

Softcover (also known as softback) version.

You can pay for Springer Books with Visa, Mastercard, American Express or Paypal.

Standard shipping is free of charge for individual customers.

 
$209.00

(net) price for USA

ISBN 978-90-481-7336-5

free shipping for individuals worldwide

usually dispatched within 3 to 5 business days


add to marked items

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short.

The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

The author, José Luis Huertas, is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.

Content Level » Professional/practitioner

Keywords » Bandpass - FRET - Frontiers Electronic Test - Mixed-Signal Circuits - Oscillation-Based - Signal - development - modeling - simulation - testing

Related subjects » Circuits & Systems - Electronics & Electrical Engineering - Mechanical Engineering

Table of contents 

1 Oscillation-Based Test Methodology. 1.1. Linking Oscillation with Testing: OBT Methodology. 1.2. The OBT oscillator. 1.3. The OBT concept revisited: proposal for robust OBT. 1.4. Conclusions: summarizing the new OBT concept. 2 Mathematical Review of Non-linear Oscillators. 2.1. Framework. 2.2. The Describing Function Method. 2.3. Applying the DF approach. 2.4. Error bound calculation for the DF approach. 2.5. Summary. 3 OBT Methodology for Discrete-Time Filters. 3.1. Feasible OBT strategy in discrete-time filters. 3.2. Application to a particular biquad structure. 3.3. Towards a general OBT biquad structure: Generic Oscillator. 3.4. Summary. 4 OBT Methodology for Modulators. 4.1. OBT Concept in Low-pass discrete-time SD modulators. 4.2. OBT Concept in Bandpass discrete-time SD modulators. 4.3. Practical OBT scheme for any type of modulators. 4.4. Summary. 5 OBT Implementation in Discrete-Time Filters. 5.1. A specific circuit. 5.2. Some practical examples. 5.3. Fault coverage considerations. 5.4. Oscillator Modelling Accuracy. 5.5. DTMF Biquad Validation. 5.6. Summary. 6 Practical considerations for OBT-OBIST application. 6.1. Applying the OBT-OBIST Methodology to the DTMF Macrocell. 6.2. On-chip evaluation of OBT output signals. 6.3. Electrical Simulation Results in the BIST Mode. 6.4. Digital Processing Part of the DTMF. 6.5. DTMF/OBIST operation modes description. 6.6. Summary. 7 OBT/OBIST silicon validation. 7.1. Introduction. 7.2. First Experimental Circuit Demonstrator. 7.3. Second Circuit Demonstrator: DTMF receiver. 7.4. Summary. Appendices. Conclusions. References.

Popular Content within this publication 

 

Articles

Read this Book on Springerlink

Services for this book

New Book Alert

Get alerted on new Springer publications in the subject area of Circuits and Systems.